{"keyword":["WORKSHOP"],"title":"Pattern Generation for a Deterministic BIST Scheme","year":"1995","author":[{"first_name":"Sybille","id":"209","orcid":"0000-0002-3717-3939","last_name":"Hellebrand","full_name":"Hellebrand, Sybille"},{"first_name":"Birgit","full_name":"Reeb, Birgit","last_name":"Reeb"},{"full_name":"Tarnick, Steffen","last_name":"Tarnick","first_name":"Steffen"},{"first_name":"Hans-Joachim","full_name":"Wunderlich, Hans-Joachim","last_name":"Wunderlich"}],"language":[{"iso":"eng"}],"_id":"13086","user_id":"659","department":[{"_id":"48"}],"place":"2nd IEEE International Test Synthesis Workshop, Santa Barbara, CA","date_created":"2019-08-28T12:13:37Z","status":"public","type":"misc","citation":{"mla":"Hellebrand, Sybille, et al. <i>Pattern Generation for a Deterministic BIST Scheme</i>. 1995.","apa":"Hellebrand, S., Reeb, B., Tarnick, S., &#38; Wunderlich, H.-J. (1995). <i>Pattern Generation for a Deterministic BIST Scheme</i>. 2nd IEEE International Test Synthesis Workshop, Santa Barbara, CA.","bibtex":"@book{Hellebrand_Reeb_Tarnick_Wunderlich_1995, place={2nd IEEE International Test Synthesis Workshop, Santa Barbara, CA}, title={Pattern Generation for a Deterministic BIST Scheme}, author={Hellebrand, Sybille and Reeb, Birgit and Tarnick, Steffen and Wunderlich, Hans-Joachim}, year={1995} }","ieee":"S. Hellebrand, B. Reeb, S. Tarnick, and H.-J. Wunderlich, <i>Pattern Generation for a Deterministic BIST Scheme</i>. 2nd IEEE International Test Synthesis Workshop, Santa Barbara, CA, 1995.","short":"S. Hellebrand, B. Reeb, S. Tarnick, H.-J. Wunderlich, Pattern Generation for a Deterministic BIST Scheme, 2nd IEEE International Test Synthesis Workshop, Santa Barbara, CA, 1995.","ama":"Hellebrand S, Reeb B, Tarnick S, Wunderlich H-J. <i>Pattern Generation for a Deterministic BIST Scheme</i>. 2nd IEEE International Test Synthesis Workshop, Santa Barbara, CA; 1995.","chicago":"Hellebrand, Sybille, Birgit Reeb, Steffen Tarnick, and Hans-Joachim Wunderlich. <i>Pattern Generation for a Deterministic BIST Scheme</i>. 2nd IEEE International Test Synthesis Workshop, Santa Barbara, CA, 1995."},"date_updated":"2022-01-06T06:51:28Z","extern":"1"}