{"title":"STARBIST: Scan Autocorrelated Random Pattern Generation","year":"1997","department":[{"_id":"48"}],"type":"misc","language":[{"iso":"eng"}],"user_id":"659","keyword":["WORKSHOP"],"author":[{"first_name":"Kun-Han","last_name":"Tsai","full_name":"Tsai, Kun-Han"},{"first_name":"Sybille","orcid":"0000-0002-3717-3939","id":"209","full_name":"Hellebrand, Sybille","last_name":"Hellebrand"},{"last_name":"Rajski","full_name":"Rajski, Janusz","first_name":"Janusz"},{"full_name":"Marek-Sadowska, Malgorzata","last_name":"Marek-Sadowska","first_name":"Malgorzata"}],"_id":"13089","citation":{"short":"K.-H. Tsai, S. Hellebrand, J. Rajski, M. Marek-Sadowska, STARBIST: Scan Autocorrelated Random Pattern Generation, 4th IEEE International Test Synthesis Workshop, Santa Barbara, CA, USA, 1997.","bibtex":"@book{Tsai_Hellebrand_Rajski_Marek-Sadowska_1997, place={4th IEEE International Test Synthesis Workshop, Santa Barbara, CA, USA}, title={STARBIST: Scan Autocorrelated Random Pattern Generation}, author={Tsai, Kun-Han and Hellebrand, Sybille and Rajski, Janusz and Marek-Sadowska, Malgorzata}, year={1997} }","ama":"Tsai K-H, Hellebrand S, Rajski J, Marek-Sadowska M. <i>STARBIST: Scan Autocorrelated Random Pattern Generation</i>. 4th IEEE International Test Synthesis Workshop, Santa Barbara, CA, USA; 1997.","mla":"Tsai, Kun-Han, et al. <i>STARBIST: Scan Autocorrelated Random Pattern Generation</i>. 1997.","ieee":"K.-H. Tsai, S. Hellebrand, J. Rajski, and M. Marek-Sadowska, <i>STARBIST: Scan Autocorrelated Random Pattern Generation</i>. 4th IEEE International Test Synthesis Workshop, Santa Barbara, CA, USA, 1997.","chicago":"Tsai, Kun-Han, Sybille Hellebrand, Janusz Rajski, and Malgorzata Marek-Sadowska. <i>STARBIST: Scan Autocorrelated Random Pattern Generation</i>. 4th IEEE International Test Synthesis Workshop, Santa Barbara, CA, USA, 1997.","apa":"Tsai, K.-H., Hellebrand, S., Rajski, J., &#38; Marek-Sadowska, M. (1997). <i>STARBIST: Scan Autocorrelated Random Pattern Generation</i>. 4th IEEE International Test Synthesis Workshop, Santa Barbara, CA, USA."},"extern":"1","date_created":"2019-08-28T12:15:05Z","date_updated":"2022-01-06T06:51:28Z","place":"4th IEEE International Test Synthesis Workshop, Santa Barbara, CA, USA","status":"public"}