{"date_created":"2019-08-28T12:16:04Z","language":[{"iso":"eng"}],"_id":"13091","user_id":"659","type":"misc","year":"1998","date_updated":"2022-01-06T06:51:28Z","extern":"1","department":[{"_id":"48"}],"place":"5th IEEE International Test Synthesis Workshop, Santa Barbara, CA, USA","title":"Efficient Consistency Checking for Embedded Memories","keyword":["WORKSHOP"],"author":[{"first_name":"Vyacheslav","full_name":"N. Yarmolik, Vyacheslav","last_name":"N. Yarmolik"},{"first_name":"Sybille","last_name":"Hellebrand","id":"209","orcid":"0000-0002-3717-3939","full_name":"Hellebrand, Sybille"},{"full_name":"Wunderlich, Hans-Joachim","last_name":"Wunderlich","first_name":"Hans-Joachim"}],"status":"public","citation":{"mla":"N. Yarmolik, Vyacheslav, et al. <i>Efficient Consistency Checking for Embedded Memories</i>. 1998.","chicago":"N. Yarmolik, Vyacheslav, Sybille Hellebrand, and Hans-Joachim Wunderlich. <i>Efficient Consistency Checking for Embedded Memories</i>. 5th IEEE International Test Synthesis Workshop, Santa Barbara, CA, USA, 1998.","apa":"N. Yarmolik, V., Hellebrand, S., &#38; Wunderlich, H.-J. (1998). <i>Efficient Consistency Checking for Embedded Memories</i>. 5th IEEE International Test Synthesis Workshop, Santa Barbara, CA, USA.","short":"V. N. Yarmolik, S. Hellebrand, H.-J. Wunderlich, Efficient Consistency Checking for Embedded Memories, 5th IEEE International Test Synthesis Workshop, Santa Barbara, CA, USA, 1998.","ieee":"V. N. Yarmolik, S. Hellebrand, and H.-J. Wunderlich, <i>Efficient Consistency Checking for Embedded Memories</i>. 5th IEEE International Test Synthesis Workshop, Santa Barbara, CA, USA, 1998.","bibtex":"@book{N. Yarmolik_Hellebrand_Wunderlich_1998, place={5th IEEE International Test Synthesis Workshop, Santa Barbara, CA, USA}, title={Efficient Consistency Checking for Embedded Memories}, author={N. Yarmolik, Vyacheslav and Hellebrand, Sybille and Wunderlich, Hans-Joachim}, year={1998} }","ama":"N. Yarmolik V, Hellebrand S, Wunderlich H-J. <i>Efficient Consistency Checking for Embedded Memories</i>. 5th IEEE International Test Synthesis Workshop, Santa Barbara, CA, USA; 1998."}}