{"type":"misc","status":"public","date_created":"2019-08-28T12:19:25Z","extern":"1","date_updated":"2022-01-06T06:51:28Z","citation":{"chicago":"Liang, Hua-Guo, Sybille Hellebrand, and Hans-Joachim Wunderlich. Two-Dimensional Test Data Compression for Scan-Based Deterministic BIST. IEEE European Test Workshop, Stockholm, Sweden, 2001.","apa":"Liang, H.-G., Hellebrand, S., & Wunderlich, H.-J. (2001). Two-Dimensional Test Data Compression for Scan-Based Deterministic BIST. IEEE European Test Workshop, Stockholm, Sweden.","mla":"Liang, Hua-Guo, et al. Two-Dimensional Test Data Compression for Scan-Based Deterministic BIST. 2001.","short":"H.-G. Liang, S. Hellebrand, H.-J. Wunderlich, Two-Dimensional Test Data Compression for Scan-Based Deterministic BIST, IEEE European Test Workshop, Stockholm, Sweden, 2001.","ama":"Liang H-G, Hellebrand S, Wunderlich H-J. Two-Dimensional Test Data Compression for Scan-Based Deterministic BIST. IEEE European Test Workshop, Stockholm, Sweden; 2001.","ieee":"H.-G. Liang, S. Hellebrand, and H.-J. Wunderlich, Two-Dimensional Test Data Compression for Scan-Based Deterministic BIST. IEEE European Test Workshop, Stockholm, Sweden, 2001.","bibtex":"@book{Liang_Hellebrand_Wunderlich_2001, place={IEEE European Test Workshop, Stockholm, Sweden}, title={Two-Dimensional Test Data Compression for Scan-Based Deterministic BIST}, author={Liang, Hua-Guo and Hellebrand, Sybille and Wunderlich, Hans-Joachim}, year={2001} }"},"_id":"13096","language":[{"iso":"eng"}],"year":"2001","author":[{"first_name":"Hua-Guo","last_name":"Liang","full_name":"Liang, Hua-Guo"},{"orcid":"0000-0002-3717-3939","full_name":"Hellebrand, Sybille","last_name":"Hellebrand","first_name":"Sybille","id":"209"},{"full_name":"Wunderlich, Hans-Joachim","last_name":"Wunderlich","first_name":"Hans-Joachim"}],"title":"Two-Dimensional Test Data Compression for Scan-Based Deterministic BIST","keyword":["WORKSHOP"],"place":"IEEE European Test Workshop, Stockholm, Sweden","department":[{"_id":"48"}],"user_id":"659"}