{"title":"Two-Dimensional Test Data Compression for Scan-Based Deterministic BIST","status":"public","date_created":"2019-08-28T12:19:25Z","date_updated":"2022-01-06T06:51:28Z","department":[{"_id":"48"}],"author":[{"last_name":"Liang","first_name":"Hua-Guo","full_name":"Liang, Hua-Guo"},{"full_name":"Hellebrand, Sybille","first_name":"Sybille","last_name":"Hellebrand","orcid":"0000-0002-3717-3939","id":"209"},{"first_name":"Hans-Joachim","full_name":"Wunderlich, Hans-Joachim","last_name":"Wunderlich"}],"_id":"13096","type":"misc","extern":"1","keyword":["WORKSHOP"],"year":"2001","language":[{"iso":"eng"}],"place":"IEEE European Test Workshop, Stockholm, Sweden","user_id":"659","citation":{"bibtex":"@book{Liang_Hellebrand_Wunderlich_2001, place={IEEE European Test Workshop, Stockholm, Sweden}, title={Two-Dimensional Test Data Compression for Scan-Based Deterministic BIST}, author={Liang, Hua-Guo and Hellebrand, Sybille and Wunderlich, Hans-Joachim}, year={2001} }","mla":"Liang, Hua-Guo, et al. Two-Dimensional Test Data Compression for Scan-Based Deterministic BIST. 2001.","ama":"Liang H-G, Hellebrand S, Wunderlich H-J. Two-Dimensional Test Data Compression for Scan-Based Deterministic BIST. IEEE European Test Workshop, Stockholm, Sweden; 2001.","ieee":"H.-G. Liang, S. Hellebrand, and H.-J. Wunderlich, Two-Dimensional Test Data Compression for Scan-Based Deterministic BIST. IEEE European Test Workshop, Stockholm, Sweden, 2001.","short":"H.-G. Liang, S. Hellebrand, H.-J. Wunderlich, Two-Dimensional Test Data Compression for Scan-Based Deterministic BIST, IEEE European Test Workshop, Stockholm, Sweden, 2001.","apa":"Liang, H.-G., Hellebrand, S., & Wunderlich, H.-J. (2001). Two-Dimensional Test Data Compression for Scan-Based Deterministic BIST. IEEE European Test Workshop, Stockholm, Sweden.","chicago":"Liang, Hua-Guo, Sybille Hellebrand, and Hans-Joachim Wunderlich. Two-Dimensional Test Data Compression for Scan-Based Deterministic BIST. IEEE European Test Workshop, Stockholm, Sweden, 2001."}}