[{"keyword":["WORKSHOP"],"date_created":"2019-08-28T12:19:25Z","citation":{"bibtex":"@book{Liang_Hellebrand_Wunderlich_2001, place={IEEE European Test Workshop, Stockholm, Sweden}, title={Two-Dimensional Test Data Compression for Scan-Based Deterministic BIST}, author={Liang, Hua-Guo and Hellebrand, Sybille and Wunderlich, Hans-Joachim}, year={2001} }","chicago":"Liang, Hua-Guo, Sybille Hellebrand, and Hans-Joachim Wunderlich. <i>Two-Dimensional Test Data Compression for Scan-Based Deterministic BIST</i>. IEEE European Test Workshop, Stockholm, Sweden, 2001.","apa":"Liang, H.-G., Hellebrand, S., &#38; Wunderlich, H.-J. (2001). <i>Two-Dimensional Test Data Compression for Scan-Based Deterministic BIST</i>. IEEE European Test Workshop, Stockholm, Sweden.","ama":"Liang H-G, Hellebrand S, Wunderlich H-J. <i>Two-Dimensional Test Data Compression for Scan-Based Deterministic BIST</i>. IEEE European Test Workshop, Stockholm, Sweden; 2001.","short":"H.-G. Liang, S. Hellebrand, H.-J. Wunderlich, Two-Dimensional Test Data Compression for Scan-Based Deterministic BIST, IEEE European Test Workshop, Stockholm, Sweden, 2001.","ieee":"H.-G. Liang, S. Hellebrand, and H.-J. Wunderlich, <i>Two-Dimensional Test Data Compression for Scan-Based Deterministic BIST</i>. IEEE European Test Workshop, Stockholm, Sweden, 2001.","mla":"Liang, Hua-Guo, et al. <i>Two-Dimensional Test Data Compression for Scan-Based Deterministic BIST</i>. 2001."},"status":"public","author":[{"last_name":"Liang","first_name":"Hua-Guo","full_name":"Liang, Hua-Guo"},{"full_name":"Hellebrand, Sybille","first_name":"Sybille","last_name":"Hellebrand","id":"209"},{"last_name":"Wunderlich","first_name":"Hans-Joachim","full_name":"Wunderlich, Hans-Joachim"}],"_id":"13096","language":[{"iso":"eng"}],"extern":"1","place":"IEEE European Test Workshop, Stockholm, Sweden","year":"2001","user_id":"659","date_updated":"2019-08-28T12:19:46Z","title":"Two-Dimensional Test Data Compression for Scan-Based Deterministic BIST","department":[{"_id":"48"}],"type":"misc"}]