[{"keyword":["WORKSHOP"],"department":[{"_id":"48"}],"author":[{"last_name":"Hellebrand","id":"209","first_name":"Sybille","full_name":"Hellebrand, Sybille","orcid":"0000-0002-3717-3939"},{"full_name":"Wuertenberger, Armin","first_name":"Armin","last_name":"Wuertenberger"},{"first_name":"Christofer","full_name":"S. Tautermann, Christofer","last_name":"S. Tautermann"}],"date_created":"2019-08-28T12:21:58Z","status":"public","extern":"1","place":"9th IEEE European Test Symposium, Ajaccio, Corsica, France","title":"Data Compression for Multiple Scan Chains Using Dictionaries with Corrections","user_id":"659","year":"2004","citation":{"chicago":"Hellebrand, Sybille, Armin Wuertenberger, and Christofer S. Tautermann. Data Compression for Multiple Scan Chains Using Dictionaries with Corrections. 9th IEEE European Test Symposium, Ajaccio, Corsica, France, 2004.","apa":"Hellebrand, S., Wuertenberger, A., & S. Tautermann, C. (2004). Data Compression for Multiple Scan Chains Using Dictionaries with Corrections. 9th IEEE European Test Symposium, Ajaccio, Corsica, France.","ama":"Hellebrand S, Wuertenberger A, S. Tautermann C. Data Compression for Multiple Scan Chains Using Dictionaries with Corrections. 9th IEEE European Test Symposium, Ajaccio, Corsica, France; 2004.","bibtex":"@book{Hellebrand_Wuertenberger_S. Tautermann_2004, place={9th IEEE European Test Symposium, Ajaccio, Corsica, France}, title={Data Compression for Multiple Scan Chains Using Dictionaries with Corrections}, author={Hellebrand, Sybille and Wuertenberger, Armin and S. Tautermann, Christofer}, year={2004} }","mla":"Hellebrand, Sybille, et al. Data Compression for Multiple Scan Chains Using Dictionaries with Corrections. 2004.","short":"S. Hellebrand, A. Wuertenberger, C. S. Tautermann, Data Compression for Multiple Scan Chains Using Dictionaries with Corrections, 9th IEEE European Test Symposium, Ajaccio, Corsica, France, 2004.","ieee":"S. Hellebrand, A. Wuertenberger, and C. S. Tautermann, Data Compression for Multiple Scan Chains Using Dictionaries with Corrections. 9th IEEE European Test Symposium, Ajaccio, Corsica, France, 2004."},"type":"misc","language":[{"iso":"eng"}],"date_updated":"2022-01-06T06:51:28Z","_id":"13100"}]