{"title":"Data Compression for Multiple Scan Chains Using Dictionaries with Corrections","year":"2004","user_id":"659","department":[{"_id":"48"}],"type":"misc","language":[{"iso":"eng"}],"author":[{"full_name":"Hellebrand, Sybille","last_name":"Hellebrand","orcid":"0000-0002-3717-3939","id":"209","first_name":"Sybille"},{"full_name":"Wuertenberger, Armin","last_name":"Wuertenberger","first_name":"Armin"},{"last_name":"S. Tautermann","full_name":"S. Tautermann, Christofer","first_name":"Christofer"}],"keyword":["WORKSHOP"],"citation":{"chicago":"Hellebrand, Sybille, Armin Wuertenberger, and Christofer S. Tautermann. <i>Data Compression for Multiple Scan Chains Using Dictionaries with Corrections</i>. 9th IEEE European Test Symposium, Ajaccio, Corsica, France, 2004.","ieee":"S. Hellebrand, A. Wuertenberger, and C. S. Tautermann, <i>Data Compression for Multiple Scan Chains Using Dictionaries with Corrections</i>. 9th IEEE European Test Symposium, Ajaccio, Corsica, France, 2004.","apa":"Hellebrand, S., Wuertenberger, A., &#38; S. Tautermann, C. (2004). <i>Data Compression for Multiple Scan Chains Using Dictionaries with Corrections</i>. 9th IEEE European Test Symposium, Ajaccio, Corsica, France.","bibtex":"@book{Hellebrand_Wuertenberger_S. Tautermann_2004, place={9th IEEE European Test Symposium, Ajaccio, Corsica, France}, title={Data Compression for Multiple Scan Chains Using Dictionaries with Corrections}, author={Hellebrand, Sybille and Wuertenberger, Armin and S. Tautermann, Christofer}, year={2004} }","ama":"Hellebrand S, Wuertenberger A, S. Tautermann C. <i>Data Compression for Multiple Scan Chains Using Dictionaries with Corrections</i>. 9th IEEE European Test Symposium, Ajaccio, Corsica, France; 2004.","short":"S. Hellebrand, A. Wuertenberger, C. S. Tautermann, Data Compression for Multiple Scan Chains Using Dictionaries with Corrections, 9th IEEE European Test Symposium, Ajaccio, Corsica, France, 2004.","mla":"Hellebrand, Sybille, et al. <i>Data Compression for Multiple Scan Chains Using Dictionaries with Corrections</i>. 2004."},"_id":"13100","extern":"1","date_created":"2019-08-28T12:21:58Z","status":"public","date_updated":"2022-01-06T06:51:28Z","place":"9th IEEE European Test Symposium, Ajaccio, Corsica, France"}