{"keyword":["WORKSHOP"],"language":[{"iso":"eng"}],"user_id":"659","author":[{"full_name":"Oehler, Philipp","first_name":"Philipp","last_name":"Oehler"},{"last_name":"Hellebrand","first_name":"Sybille","id":"209","orcid":"0000-0002-3717-3939","full_name":"Hellebrand, Sybille"}],"date_created":"2019-08-28T12:23:10Z","department":[{"_id":"48"}],"citation":{"chicago":"Oehler, Philipp, and Sybille Hellebrand. <i>Power Consumption Versus Error Correcting Capabilities in Embedded DRAMs - A Case Study</i>. 17th GI/ITG/GMM Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen”, Innsbruck, Austria, 2005.","apa":"Oehler, P., &#38; Hellebrand, S. (2005). <i>Power Consumption Versus Error Correcting Capabilities in Embedded DRAMs - A Case Study</i>. 17th GI/ITG/GMM Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen”, Innsbruck, Austria.","bibtex":"@book{Oehler_Hellebrand_2005, place={17th GI/ITG/GMM Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen”, Innsbruck, Austria}, title={Power Consumption Versus Error Correcting Capabilities in Embedded DRAMs - A Case Study}, author={Oehler, Philipp and Hellebrand, Sybille}, year={2005} }","short":"P. Oehler, S. Hellebrand, Power Consumption Versus Error Correcting Capabilities in Embedded DRAMs - A Case Study, 17th GI/ITG/GMM Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen”, Innsbruck, Austria, 2005.","mla":"Oehler, Philipp, and Sybille Hellebrand. <i>Power Consumption Versus Error Correcting Capabilities in Embedded DRAMs - A Case Study</i>. 2005.","ama":"Oehler P, Hellebrand S. <i>Power Consumption Versus Error Correcting Capabilities in Embedded DRAMs - A Case Study</i>. 17th GI/ITG/GMM Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen”, Innsbruck, Austria; 2005.","ieee":"P. Oehler and S. Hellebrand, <i>Power Consumption Versus Error Correcting Capabilities in Embedded DRAMs - A Case Study</i>. 17th GI/ITG/GMM Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen”, Innsbruck, Austria, 2005."},"status":"public","type":"misc","place":"17th GI/ITG/GMM Workshop \"Testmethoden und Zuverlässigkeit von Schaltungen und Systemen\", Innsbruck, Austria","title":"Power Consumption Versus Error Correcting Capabilities in Embedded DRAMs - A Case Study","year":"2005","_id":"13102","date_updated":"2022-01-06T06:51:28Z"}