{"year":"2005","date_updated":"2022-01-06T06:51:28Z","author":[{"last_name":"Oehler","full_name":"Oehler, Philipp","first_name":"Philipp"},{"last_name":"Hellebrand","orcid":"0000-0002-3717-3939","id":"209","first_name":"Sybille","full_name":"Hellebrand, Sybille"}],"citation":{"ama":"Oehler P, Hellebrand S. <i>Power Consumption Versus Error Correcting Capabilities in Embedded DRAMs - A Case Study</i>. 17th GI/ITG/GMM Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen”, Innsbruck, Austria; 2005.","ieee":"P. Oehler and S. Hellebrand, <i>Power Consumption Versus Error Correcting Capabilities in Embedded DRAMs - A Case Study</i>. 17th GI/ITG/GMM Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen”, Innsbruck, Austria, 2005.","chicago":"Oehler, Philipp, and Sybille Hellebrand. <i>Power Consumption Versus Error Correcting Capabilities in Embedded DRAMs - A Case Study</i>. 17th GI/ITG/GMM Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen”, Innsbruck, Austria, 2005.","bibtex":"@book{Oehler_Hellebrand_2005, place={17th GI/ITG/GMM Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen”, Innsbruck, Austria}, title={Power Consumption Versus Error Correcting Capabilities in Embedded DRAMs - A Case Study}, author={Oehler, Philipp and Hellebrand, Sybille}, year={2005} }","short":"P. Oehler, S. Hellebrand, Power Consumption Versus Error Correcting Capabilities in Embedded DRAMs - A Case Study, 17th GI/ITG/GMM Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen”, Innsbruck, Austria, 2005.","apa":"Oehler, P., &#38; Hellebrand, S. (2005). <i>Power Consumption Versus Error Correcting Capabilities in Embedded DRAMs - A Case Study</i>. 17th GI/ITG/GMM Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen”, Innsbruck, Austria.","mla":"Oehler, Philipp, and Sybille Hellebrand. <i>Power Consumption Versus Error Correcting Capabilities in Embedded DRAMs - A Case Study</i>. 2005."},"date_created":"2019-08-28T12:23:10Z","keyword":["WORKSHOP"],"department":[{"_id":"48"}],"status":"public","type":"misc","_id":"13102","title":"Power Consumption Versus Error Correcting Capabilities in Embedded DRAMs - A Case Study","language":[{"iso":"eng"}],"user_id":"659","place":"17th GI/ITG/GMM Workshop \"Testmethoden und Zuverlässigkeit von Schaltungen und Systemen\", Innsbruck, Austria"}