{"title":"Power Consumption Versus Error Correcting Capabilities in Embedded DRAMs - A Case Study","language":[{"iso":"eng"}],"date_updated":"2022-01-06T06:51:28Z","year":"2005","place":"17th GI/ITG/GMM Workshop \"Testmethoden und Zuverlässigkeit von Schaltungen und Systemen\", Innsbruck, Austria","author":[{"full_name":"Oehler, Philipp","last_name":"Oehler","first_name":"Philipp"},{"full_name":"Hellebrand, Sybille","id":"209","last_name":"Hellebrand","first_name":"Sybille","orcid":"0000-0002-3717-3939"}],"_id":"13102","citation":{"chicago":"Oehler, Philipp, and Sybille Hellebrand. Power Consumption Versus Error Correcting Capabilities in Embedded DRAMs - A Case Study. 17th GI/ITG/GMM Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen”, Innsbruck, Austria, 2005.","bibtex":"@book{Oehler_Hellebrand_2005, place={17th GI/ITG/GMM Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen”, Innsbruck, Austria}, title={Power Consumption Versus Error Correcting Capabilities in Embedded DRAMs - A Case Study}, author={Oehler, Philipp and Hellebrand, Sybille}, year={2005} }","short":"P. Oehler, S. Hellebrand, Power Consumption Versus Error Correcting Capabilities in Embedded DRAMs - A Case Study, 17th GI/ITG/GMM Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen”, Innsbruck, Austria, 2005.","ama":"Oehler P, Hellebrand S. Power Consumption Versus Error Correcting Capabilities in Embedded DRAMs - A Case Study. 17th GI/ITG/GMM Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen”, Innsbruck, Austria; 2005.","apa":"Oehler, P., & Hellebrand, S. (2005). Power Consumption Versus Error Correcting Capabilities in Embedded DRAMs - A Case Study. 17th GI/ITG/GMM Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen”, Innsbruck, Austria.","ieee":"P. Oehler and S. Hellebrand, Power Consumption Versus Error Correcting Capabilities in Embedded DRAMs - A Case Study. 17th GI/ITG/GMM Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen”, Innsbruck, Austria, 2005.","mla":"Oehler, Philipp, and Sybille Hellebrand. Power Consumption Versus Error Correcting Capabilities in Embedded DRAMs - A Case Study. 2005."},"type":"misc","keyword":["WORKSHOP"],"user_id":"659","date_created":"2019-08-28T12:23:10Z","department":[{"_id":"48"}],"status":"public"}