{"date_updated":"2022-01-06T06:51:28Z","type":"misc","year":"1990","user_id":"659","_id":"13103","language":[{"iso":"eng"}],"date_created":"2019-08-28T12:23:40Z","citation":{"ieee":"S. Hellebrand, H.-J. Wunderlich, and O. F. Haberl, <i>Generating Pseudo-Exhaustive Vectors for External Testing</i>. IEEE Design for Testability Workshop, Vail, CO, USA, 1990.","chicago":"Hellebrand, Sybille, Hans-Joachim Wunderlich, and Oliver F. Haberl. <i>Generating Pseudo-Exhaustive Vectors for External Testing</i>. IEEE Design for Testability Workshop, Vail, CO, USA, 1990.","ama":"Hellebrand S, Wunderlich H-J, F. Haberl O. <i>Generating Pseudo-Exhaustive Vectors for External Testing</i>. IEEE Design for Testability Workshop, Vail, CO, USA; 1990.","bibtex":"@book{Hellebrand_Wunderlich_F. Haberl_1990, place={IEEE Design for Testability Workshop, Vail, CO, USA}, title={Generating Pseudo-Exhaustive Vectors for External Testing}, author={Hellebrand, Sybille and Wunderlich, Hans-Joachim and F. Haberl, Oliver}, year={1990} }","short":"S. Hellebrand, H.-J. Wunderlich, O. F. Haberl, Generating Pseudo-Exhaustive Vectors for External Testing, IEEE Design for Testability Workshop, Vail, CO, USA, 1990.","apa":"Hellebrand, S., Wunderlich, H.-J., &#38; F. Haberl, O. (1990). <i>Generating Pseudo-Exhaustive Vectors for External Testing</i>. IEEE Design for Testability Workshop, Vail, CO, USA.","mla":"Hellebrand, Sybille, et al. <i>Generating Pseudo-Exhaustive Vectors for External Testing</i>. 1990."},"status":"public","title":"Generating Pseudo-Exhaustive Vectors for External Testing","keyword":["WORKSHOP"],"author":[{"first_name":"Sybille","full_name":"Hellebrand, Sybille","orcid":"0000-0002-3717-3939","id":"209","last_name":"Hellebrand"},{"full_name":"Wunderlich, Hans-Joachim","last_name":"Wunderlich","first_name":"Hans-Joachim"},{"first_name":"Oliver","last_name":"F. Haberl","full_name":"F. Haberl, Oliver"}],"department":[{"_id":"48"}],"place":"IEEE Design for Testability Workshop, Vail, CO, USA","extern":"1"}