[{"status":"public","type":"misc","date_created":"2019-08-28T12:23:40Z","extern":"1","user_id":"659","citation":{"short":"S. Hellebrand, H.-J. Wunderlich, O. F. Haberl, Generating Pseudo-Exhaustive Vectors for External Testing, IEEE Design for Testability Workshop, Vail, CO, USA, 1990.","apa":"Hellebrand, S., Wunderlich, H.-J., &#38; F. Haberl, O. (1990). <i>Generating Pseudo-Exhaustive Vectors for External Testing</i>. IEEE Design for Testability Workshop, Vail, CO, USA.","mla":"Hellebrand, Sybille, et al. <i>Generating Pseudo-Exhaustive Vectors for External Testing</i>. 1990.","ama":"Hellebrand S, Wunderlich H-J, F. Haberl O. <i>Generating Pseudo-Exhaustive Vectors for External Testing</i>. IEEE Design for Testability Workshop, Vail, CO, USA; 1990.","bibtex":"@book{Hellebrand_Wunderlich_F. Haberl_1990, place={IEEE Design for Testability Workshop, Vail, CO, USA}, title={Generating Pseudo-Exhaustive Vectors for External Testing}, author={Hellebrand, Sybille and Wunderlich, Hans-Joachim and F. Haberl, Oliver}, year={1990} }","chicago":"Hellebrand, Sybille, Hans-Joachim Wunderlich, and Oliver F. Haberl. <i>Generating Pseudo-Exhaustive Vectors for External Testing</i>. IEEE Design for Testability Workshop, Vail, CO, USA, 1990.","ieee":"S. Hellebrand, H.-J. Wunderlich, and O. F. Haberl, <i>Generating Pseudo-Exhaustive Vectors for External Testing</i>. IEEE Design for Testability Workshop, Vail, CO, USA, 1990."},"year":"1990","department":[{"_id":"48"}],"author":[{"id":"209","full_name":"Hellebrand, Sybille","first_name":"Sybille","last_name":"Hellebrand","orcid":"0000-0002-3717-3939"},{"first_name":"Hans-Joachim","last_name":"Wunderlich","full_name":"Wunderlich, Hans-Joachim"},{"last_name":"F. Haberl","first_name":"Oliver","full_name":"F. Haberl, Oliver"}],"language":[{"iso":"eng"}],"date_updated":"2020-05-07T05:16:11Z","place":"IEEE Design for Testability Workshop, Vail, CO, USA","_id":"13103","keyword":["WORKSHOP"],"title":"Generating Pseudo-Exhaustive Vectors for External Testing"}]