{"funded_apc":"1","doi":"10.1103/physrevb.92.085426","issue":"8","publication_status":"published","date_created":"2019-09-30T12:44:24Z","project":[{"name":"Computing Resources Provided by the Paderborn Center for Parallel Computing","_id":"52"}],"publication":"Physical Review B","type":"journal_article","date_updated":"2022-01-06T06:51:36Z","language":[{"iso":"eng"}],"citation":{"apa":"Edler, F., Miccoli, I., Demuth, S., Pfnür, H., Wippermann, S., Lücke, A., … Tegenkamp, C. (2015). Interwire coupling forIn(4×1)/Si(111) probed by surface transport. Physical Review B, 92(8). https://doi.org/10.1103/physrevb.92.085426","ieee":"F. Edler et al., “Interwire coupling forIn(4×1)/Si(111) probed by surface transport,” Physical Review B, vol. 92, no. 8, 2015.","mla":"Edler, F., et al. “Interwire Coupling ForIn(4×1)/Si(111) Probed by Surface Transport.” Physical Review B, vol. 92, no. 8, 2015, doi:10.1103/physrevb.92.085426.","ama":"Edler F, Miccoli I, Demuth S, et al. Interwire coupling forIn(4×1)/Si(111) probed by surface transport. Physical Review B. 2015;92(8). doi:10.1103/physrevb.92.085426","chicago":"Edler, F., I. Miccoli, S. Demuth, H. Pfnür, S. Wippermann, A. Lücke, Wolf Gero Schmidt, and C. Tegenkamp. “Interwire Coupling ForIn(4×1)/Si(111) Probed by Surface Transport.” Physical Review B 92, no. 8 (2015). https://doi.org/10.1103/physrevb.92.085426.","short":"F. Edler, I. Miccoli, S. Demuth, H. Pfnür, S. Wippermann, A. Lücke, W.G. Schmidt, C. Tegenkamp, Physical Review B 92 (2015).","bibtex":"@article{Edler_Miccoli_Demuth_Pfnür_Wippermann_Lücke_Schmidt_Tegenkamp_2015, title={Interwire coupling forIn(4×1)/Si(111) probed by surface transport}, volume={92}, DOI={10.1103/physrevb.92.085426}, number={8}, journal={Physical Review B}, author={Edler, F. and Miccoli, I. and Demuth, S. and Pfnür, H. and Wippermann, S. and Lücke, A. and Schmidt, Wolf Gero and Tegenkamp, C.}, year={2015} }"},"user_id":"16199","volume":92,"department":[{"_id":"15"},{"_id":"170"},{"_id":"295"}],"publication_identifier":{"issn":["1098-0121","1550-235X"]},"_id":"13496","title":"Interwire coupling forIn(4×1)/Si(111) probed by surface transport","author":[{"last_name":"Edler","full_name":"Edler, F.","first_name":"F."},{"first_name":"I.","full_name":"Miccoli, I.","last_name":"Miccoli"},{"last_name":"Demuth","full_name":"Demuth, S.","first_name":"S."},{"full_name":"Pfnür, H.","last_name":"Pfnür","first_name":"H."},{"first_name":"S.","last_name":"Wippermann","full_name":"Wippermann, S."},{"first_name":"A.","full_name":"Lücke, A.","last_name":"Lücke"},{"first_name":"Wolf Gero","orcid":"0000-0002-2717-5076","last_name":"Schmidt","id":"468","full_name":"Schmidt, Wolf Gero"},{"full_name":"Tegenkamp, C.","last_name":"Tegenkamp","first_name":"C."}],"year":"2015","intvolume":" 92","status":"public"}