{"user_id":"49109","department":[{"_id":"34"},{"_id":"7"},{"_id":"355"}],"type":"conference","language":[{"iso":"eng"}],"author":[{"first_name":"W.","full_name":"Cheng, W.","last_name":"Cheng"},{"first_name":"K.","full_name":"Dembczynski, K.","last_name":"Dembczynski"},{"first_name":"Eyke","id":"48129","last_name":"Hüllermeier","full_name":"Hüllermeier, Eyke"}],"title":"Label ranking based on the Plackett-Luce model","year":"2010","date_created":"2019-10-02T16:30:22Z","editor":[{"first_name":"J.","last_name":"Fürnkranz","full_name":"Fürnkranz, J."},{"last_name":"Joachims","full_name":"Joachims, T.","first_name":"T."}],"status":"public","date_updated":"2022-01-06T06:51:40Z","publication":"in Proceedings ICML-2010, 27th International Conference on Machine Learning, Haifa, Israel","page":"215-222","_id":"13590","citation":{"mla":"Cheng, W., et al. “Label Ranking Based on the Plackett-Luce Model.” <i>In Proceedings ICML-2010, 27th International Conference on Machine Learning, Haifa, Israel</i>, edited by J. Fürnkranz and T. Joachims, 2010, pp. 215–22.","short":"W. Cheng, K. Dembczynski, E. Hüllermeier, in: J. Fürnkranz, T. Joachims (Eds.), In Proceedings ICML-2010, 27th International Conference on Machine Learning, Haifa, Israel, 2010, pp. 215–222.","bibtex":"@inproceedings{Cheng_Dembczynski_Hüllermeier_2010, title={Label ranking based on the Plackett-Luce model}, booktitle={in Proceedings ICML-2010, 27th International Conference on Machine Learning, Haifa, Israel}, author={Cheng, W. and Dembczynski, K. and Hüllermeier, Eyke}, editor={Fürnkranz, J. and Joachims, T.Editors}, year={2010}, pages={215–222} }","ama":"Cheng W, Dembczynski K, Hüllermeier E. Label ranking based on the Plackett-Luce model. In: Fürnkranz J, Joachims T, eds. <i>In Proceedings ICML-2010, 27th International Conference on Machine Learning, Haifa, Israel</i>. ; 2010:215-222.","apa":"Cheng, W., Dembczynski, K., &#38; Hüllermeier, E. (2010). Label ranking based on the Plackett-Luce model. In J. Fürnkranz &#38; T. Joachims (Eds.), <i>in Proceedings ICML-2010, 27th International Conference on Machine Learning, Haifa, Israel</i> (pp. 215–222).","ieee":"W. Cheng, K. Dembczynski, and E. Hüllermeier, “Label ranking based on the Plackett-Luce model,” in <i>in Proceedings ICML-2010, 27th International Conference on Machine Learning, Haifa, Israel</i>, 2010, pp. 215–222.","chicago":"Cheng, W., K. Dembczynski, and Eyke Hüllermeier. “Label Ranking Based on the Plackett-Luce Model.” In <i>In Proceedings ICML-2010, 27th International Conference on Machine Learning, Haifa, Israel</i>, edited by J. Fürnkranz and T. Joachims, 215–22, 2010."}}