{"status":"public","year":"2010","author":[{"full_name":"Dembczynski, K.","last_name":"Dembczynski","first_name":"K."},{"first_name":"W.","last_name":"Waegeman","full_name":"Waegeman, W."},{"first_name":"W.","last_name":"Cheng","full_name":"Cheng, W."},{"first_name":"Eyke","id":"48129","last_name":"Hüllermeier","full_name":"Hüllermeier, Eyke"}],"_id":"13593","title":"Regret analysis for performance metrics in multi-label classification: The case of Hamming and subset zero-one loss","department":[{"_id":"34"},{"_id":"7"},{"_id":"355"}],"user_id":"49109","citation":{"apa":"Dembczynski, K., Waegeman, W., Cheng, W., &#38; Hüllermeier, E. (2010). Regret analysis for performance metrics in multi-label classification: The case of Hamming and subset zero-one loss. In <i>In Proceedings ECML/PKDD-2010, European Conference on Machine Learning and Principles and Practice of Knowledge Discovery in Databases, ,Bareclona, Spain</i>.","short":"K. Dembczynski, W. Waegeman, W. Cheng, E. Hüllermeier, in: In Proceedings ECML/PKDD-2010, European Conference on Machine Learning and Principles and Practice of Knowledge Discovery in Databases, ,Bareclona, Spain, 2010.","chicago":"Dembczynski, K., W. Waegeman, W. Cheng, and Eyke Hüllermeier. “Regret Analysis for Performance Metrics in Multi-Label Classification: The Case of Hamming and Subset Zero-One Loss.” In <i>In Proceedings ECML/PKDD-2010, European Conference on Machine Learning and Principles and Practice of Knowledge Discovery in Databases, ,Bareclona, Spain</i>, 2010.","ieee":"K. Dembczynski, W. Waegeman, W. Cheng, and E. Hüllermeier, “Regret analysis for performance metrics in multi-label classification: The case of Hamming and subset zero-one loss,” in <i>In Proceedings ECML/PKDD-2010, European Conference on Machine Learning and Principles and Practice of Knowledge Discovery in Databases, ,Bareclona, Spain</i>, 2010.","ama":"Dembczynski K, Waegeman W, Cheng W, Hüllermeier E. Regret analysis for performance metrics in multi-label classification: The case of Hamming and subset zero-one loss. In: <i>In Proceedings ECML/PKDD-2010, European Conference on Machine Learning and Principles and Practice of Knowledge Discovery in Databases, ,Bareclona, Spain</i>. ; 2010.","mla":"Dembczynski, K., et al. “Regret Analysis for Performance Metrics in Multi-Label Classification: The Case of Hamming and Subset Zero-One Loss.” <i>In Proceedings ECML/PKDD-2010, European Conference on Machine Learning and Principles and Practice of Knowledge Discovery in Databases, ,Bareclona, Spain</i>, 2010.","bibtex":"@inproceedings{Dembczynski_Waegeman_Cheng_Hüllermeier_2010, title={Regret analysis for performance metrics in multi-label classification: The case of Hamming and subset zero-one loss}, booktitle={In Proceedings ECML/PKDD-2010, European Conference on Machine Learning and Principles and Practice of Knowledge Discovery in Databases, ,Bareclona, Spain}, author={Dembczynski, K. and Waegeman, W. and Cheng, W. and Hüllermeier, Eyke}, year={2010} }"},"date_created":"2019-10-04T15:41:59Z","language":[{"iso":"eng"}],"date_updated":"2022-01-06T06:51:40Z","type":"conference","publication":"In Proceedings ECML/PKDD-2010, European Conference on Machine Learning and Principles and Practice of Knowledge Discovery in Databases, ,Bareclona, Spain"}