TY - CONF AU - Dembczynski, K. AU - Waegeman, W. AU - Cheng, W. AU - Hüllermeier, Eyke ID - 13593 T2 - In Proceedings ECML/PKDD-2010, European Conference on Machine Learning and Principles and Practice of Knowledge Discovery in Databases, ,Bareclona, Spain TI - Regret analysis for performance metrics in multi-label classification: The case of Hamming and subset zero-one loss ER -