[{"article_number":"2215","_id":"13761","language":[{"iso":"eng"}],"user_id":"16199","doi":"10.1116/1.1305289","volume":18,"year":"2000","title":"Understanding reflectance anisotropy: Surface-state signatures and bulk-related features","status":"public","publication_identifier":{"issn":["0734-211X"]},"author":[{"full_name":"Schmidt, Wolf Gero","first_name":"Wolf Gero","orcid":"0000-0002-2717-5076","last_name":"Schmidt","id":"468"},{"full_name":"Bechstedt, F.","first_name":"F.","last_name":"Bechstedt"},{"first_name":"J.","last_name":"Bernholc","full_name":"Bernholc, J."}],"publication_status":"published","date_updated":"2025-12-05T13:30:13Z","intvolume":"        18","date_created":"2019-10-10T12:45:27Z","type":"journal_article","department":[{"_id":"15"},{"_id":"170"},{"_id":"295"},{"_id":"35"},{"_id":"230"}],"issue":"4","publication":"Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures","citation":{"mla":"Schmidt, Wolf Gero, et al. “Understanding Reflectance Anisotropy: Surface-State Signatures and Bulk-Related Features.” <i>Journal of Vacuum Science &#38; Technology B: Microelectronics and Nanometer Structures</i>, vol. 18, no. 4, 2215, 2000, doi:<a href=\"https://doi.org/10.1116/1.1305289\">10.1116/1.1305289</a>.","ama":"Schmidt WG, Bechstedt F, Bernholc J. Understanding reflectance anisotropy: Surface-state signatures and bulk-related features. <i>Journal of Vacuum Science &#38; Technology B: Microelectronics and Nanometer Structures</i>. 2000;18(4). doi:<a href=\"https://doi.org/10.1116/1.1305289\">10.1116/1.1305289</a>","bibtex":"@article{Schmidt_Bechstedt_Bernholc_2000, title={Understanding reflectance anisotropy: Surface-state signatures and bulk-related features}, volume={18}, DOI={<a href=\"https://doi.org/10.1116/1.1305289\">10.1116/1.1305289</a>}, number={42215}, journal={Journal of Vacuum Science &#38; Technology B: Microelectronics and Nanometer Structures}, author={Schmidt, Wolf Gero and Bechstedt, F. and Bernholc, J.}, year={2000} }","apa":"Schmidt, W. G., Bechstedt, F., &#38; Bernholc, J. (2000). Understanding reflectance anisotropy: Surface-state signatures and bulk-related features. <i>Journal of Vacuum Science &#38; Technology B: Microelectronics and Nanometer Structures</i>, <i>18</i>(4), Article 2215. <a href=\"https://doi.org/10.1116/1.1305289\">https://doi.org/10.1116/1.1305289</a>","ieee":"W. G. Schmidt, F. Bechstedt, and J. Bernholc, “Understanding reflectance anisotropy: Surface-state signatures and bulk-related features,” <i>Journal of Vacuum Science &#38; Technology B: Microelectronics and Nanometer Structures</i>, vol. 18, no. 4, Art. no. 2215, 2000, doi: <a href=\"https://doi.org/10.1116/1.1305289\">10.1116/1.1305289</a>.","short":"W.G. Schmidt, F. Bechstedt, J. Bernholc, Journal of Vacuum Science &#38; Technology B: Microelectronics and Nanometer Structures 18 (2000).","chicago":"Schmidt, Wolf Gero, F. Bechstedt, and J. Bernholc. “Understanding Reflectance Anisotropy: Surface-State Signatures and Bulk-Related Features.” <i>Journal of Vacuum Science &#38; Technology B: Microelectronics and Nanometer Structures</i> 18, no. 4 (2000). <a href=\"https://doi.org/10.1116/1.1305289\">https://doi.org/10.1116/1.1305289</a>."}}]