{"citation":{"mla":"Esser, N., et al. “GaP(001) and InP(001): Reflectance Anisotropy and Surface Geometry.” <i>Journal of Vacuum Science &#38; Technology B: Microelectronics and Nanometer Structures</i>, vol. 17, no. 4, 1691, 1999, doi:<a href=\"https://doi.org/10.1116/1.590810\">10.1116/1.590810</a>.","chicago":"Esser, N., Wolf Gero Schmidt, J. Bernholc, A. M. Frisch, P. Vogt, M. Zorn, M. Pristovsek, et al. “GaP(001) and InP(001): Reflectance Anisotropy and Surface Geometry.” <i>Journal of Vacuum Science &#38; Technology B: Microelectronics and Nanometer Structures</i> 17, no. 4 (1999). <a href=\"https://doi.org/10.1116/1.590810\">https://doi.org/10.1116/1.590810</a>.","ieee":"N. Esser <i>et al.</i>, “GaP(001) and InP(001): Reflectance anisotropy and surface geometry,” <i>Journal of Vacuum Science &#38; Technology B: Microelectronics and Nanometer Structures</i>, vol. 17, no. 4, 1999.","short":"N. Esser, W.G. Schmidt, J. Bernholc, A.M. Frisch, P. Vogt, M. Zorn, M. Pristovsek, W. Richter, F. Bechstedt, T. Hannappel, S. Visbeck, Journal of Vacuum Science &#38; Technology B: Microelectronics and Nanometer Structures 17 (1999).","ama":"Esser N, Schmidt WG, Bernholc J, et al. GaP(001) and InP(001): Reflectance anisotropy and surface geometry. <i>Journal of Vacuum Science &#38; Technology B: Microelectronics and Nanometer Structures</i>. 1999;17(4). doi:<a href=\"https://doi.org/10.1116/1.590810\">10.1116/1.590810</a>","apa":"Esser, N., Schmidt, W. G., Bernholc, J., Frisch, A. M., Vogt, P., Zorn, M., … Visbeck, S. (1999). GaP(001) and InP(001): Reflectance anisotropy and surface geometry. <i>Journal of Vacuum Science &#38; Technology B: Microelectronics and Nanometer Structures</i>, <i>17</i>(4). <a href=\"https://doi.org/10.1116/1.590810\">https://doi.org/10.1116/1.590810</a>","bibtex":"@article{Esser_Schmidt_Bernholc_Frisch_Vogt_Zorn_Pristovsek_Richter_Bechstedt_Hannappel_et al._1999, title={GaP(001) and InP(001): Reflectance anisotropy and surface geometry}, volume={17}, DOI={<a href=\"https://doi.org/10.1116/1.590810\">10.1116/1.590810</a>}, number={41691}, journal={Journal of Vacuum Science &#38; Technology B: Microelectronics and Nanometer Structures}, author={Esser, N. and Schmidt, Wolf Gero and Bernholc, J. and Frisch, A. M. and Vogt, P. and Zorn, M. and Pristovsek, M. and Richter, W. and Bechstedt, F. and Hannappel, Th. and et al.}, year={1999} }"},"publication_identifier":{"issn":["0734-211X"]},"language":[{"iso":"eng"}],"_id":"13767","year":"1999","article_number":"1691","publication":"Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures","date_created":"2019-10-10T13:02:11Z","status":"public","author":[{"full_name":"Esser, N.","first_name":"N.","last_name":"Esser"},{"id":"468","last_name":"Schmidt","first_name":"Wolf Gero","full_name":"Schmidt, Wolf Gero","orcid":"0000-0002-2717-5076"},{"first_name":"J.","last_name":"Bernholc","full_name":"Bernholc, J."},{"full_name":"Frisch, A. M.","last_name":"Frisch","first_name":"A. M."},{"full_name":"Vogt, P.","last_name":"Vogt","first_name":"P."},{"first_name":"M.","last_name":"Zorn","full_name":"Zorn, M."},{"last_name":"Pristovsek","first_name":"M.","full_name":"Pristovsek, M."},{"full_name":"Richter, W.","last_name":"Richter","first_name":"W."},{"full_name":"Bechstedt, F.","first_name":"F.","last_name":"Bechstedt"},{"first_name":"Th.","last_name":"Hannappel","full_name":"Hannappel, Th."},{"last_name":"Visbeck","first_name":"S.","full_name":"Visbeck, S."}],"funded_apc":"1","intvolume":"        17","user_id":"16199","type":"journal_article","title":"GaP(001) and InP(001): Reflectance anisotropy and surface geometry","date_updated":"2022-01-06T06:51:43Z","publication_status":"published","volume":17,"issue":"4","department":[{"_id":"15"},{"_id":"170"},{"_id":"295"}],"doi":"10.1116/1.590810"}