[{"publication_identifier":{"issn":["0169-4332"]},"author":[{"full_name":"Hingerl, K","last_name":"Hingerl","first_name":"K"},{"full_name":"Balderas-Navarro, R.E","first_name":"R.E","last_name":"Balderas-Navarro"},{"last_name":"Bonanni","first_name":"A","full_name":"Bonanni, A"},{"full_name":"Tichopadek, P","last_name":"Tichopadek","first_name":"P"},{"id":"468","orcid":"0000-0002-2717-5076","first_name":"Wolf Gero","last_name":"Schmidt","full_name":"Schmidt, Wolf Gero"}],"status":"public","year":"2001","title":"On the origin of resonance features in reflectance difference data of silicon","publication_status":"published","date_updated":"2025-12-16T07:35:41Z","_id":"13847","language":[{"iso":"eng"}],"page":"769-776","volume":"175-176","user_id":"16199","doi":"10.1016/s0169-4332(01)00114-3","citation":{"ama":"Hingerl K, Balderas-Navarro RE, Bonanni A, Tichopadek P, Schmidt WG. On the origin of resonance features in reflectance difference data of silicon. <i>Applied Surface Science</i>. 2001;175-176:769-776. doi:<a href=\"https://doi.org/10.1016/s0169-4332(01)00114-3\">10.1016/s0169-4332(01)00114-3</a>","bibtex":"@article{Hingerl_Balderas-Navarro_Bonanni_Tichopadek_Schmidt_2001, title={On the origin of resonance features in reflectance difference data of silicon}, volume={175–176}, DOI={<a href=\"https://doi.org/10.1016/s0169-4332(01)00114-3\">10.1016/s0169-4332(01)00114-3</a>}, journal={Applied Surface Science}, author={Hingerl, K and Balderas-Navarro, R.E and Bonanni, A and Tichopadek, P and Schmidt, Wolf Gero}, year={2001}, pages={769–776} }","mla":"Hingerl, K., et al. “On the Origin of Resonance Features in Reflectance Difference Data of Silicon.” <i>Applied Surface Science</i>, vol. 175–176, 2001, pp. 769–76, doi:<a href=\"https://doi.org/10.1016/s0169-4332(01)00114-3\">10.1016/s0169-4332(01)00114-3</a>.","short":"K. Hingerl, R.E. Balderas-Navarro, A. Bonanni, P. Tichopadek, W.G. Schmidt, Applied Surface Science 175–176 (2001) 769–776.","chicago":"Hingerl, K, R.E Balderas-Navarro, A Bonanni, P Tichopadek, and Wolf Gero Schmidt. “On the Origin of Resonance Features in Reflectance Difference Data of Silicon.” <i>Applied Surface Science</i> 175–176 (2001): 769–76. <a href=\"https://doi.org/10.1016/s0169-4332(01)00114-3\">https://doi.org/10.1016/s0169-4332(01)00114-3</a>.","apa":"Hingerl, K., Balderas-Navarro, R. E., Bonanni, A., Tichopadek, P., &#38; Schmidt, W. G. (2001). On the origin of resonance features in reflectance difference data of silicon. <i>Applied Surface Science</i>, <i>175–176</i>, 769–776. <a href=\"https://doi.org/10.1016/s0169-4332(01)00114-3\">https://doi.org/10.1016/s0169-4332(01)00114-3</a>","ieee":"K. Hingerl, R. E. Balderas-Navarro, A. Bonanni, P. Tichopadek, and W. G. Schmidt, “On the origin of resonance features in reflectance difference data of silicon,” <i>Applied Surface Science</i>, vol. 175–176, pp. 769–776, 2001, doi: <a href=\"https://doi.org/10.1016/s0169-4332(01)00114-3\">10.1016/s0169-4332(01)00114-3</a>."},"publication":"Applied Surface Science","date_created":"2019-10-15T09:32:03Z","department":[{"_id":"15"},{"_id":"170"},{"_id":"295"},{"_id":"35"},{"_id":"230"}],"type":"journal_article"}]