article published K Hingerl author R.E Balderas-Navarro author A Bonanni author P Tichopadek author Wolf Gero Schmidt author 4680000-0002-2717-5076 15 department 170 department 295 department 35 department 230 department 2001 eng 0169-433210.1016/s0169-4332(01)00114-3 175-176769-776 Hingerl, K., Balderas-Navarro, R. E., Bonanni, A., Tichopadek, P., &#38; Schmidt, W. G. (2001). On the origin of resonance features in reflectance difference data of silicon. <i>Applied Surface Science</i>, <i>175–176</i>, 769–776. <a href="https://doi.org/10.1016/s0169-4332(01)00114-3">https://doi.org/10.1016/s0169-4332(01)00114-3</a> K. Hingerl, R.E. Balderas-Navarro, A. Bonanni, P. Tichopadek, W.G. Schmidt, Applied Surface Science 175–176 (2001) 769–776. @article{Hingerl_Balderas-Navarro_Bonanni_Tichopadek_Schmidt_2001, title={On the origin of resonance features in reflectance difference data of silicon}, volume={175–176}, DOI={<a href="https://doi.org/10.1016/s0169-4332(01)00114-3">10.1016/s0169-4332(01)00114-3</a>}, journal={Applied Surface Science}, author={Hingerl, K and Balderas-Navarro, R.E and Bonanni, A and Tichopadek, P and Schmidt, Wolf Gero}, year={2001}, pages={769–776} } Hingerl, K., et al. “On the Origin of Resonance Features in Reflectance Difference Data of Silicon.” <i>Applied Surface Science</i>, vol. 175–176, 2001, pp. 769–76, doi:<a href="https://doi.org/10.1016/s0169-4332(01)00114-3">10.1016/s0169-4332(01)00114-3</a>. Hingerl K, Balderas-Navarro RE, Bonanni A, Tichopadek P, Schmidt WG. On the origin of resonance features in reflectance difference data of silicon. <i>Applied Surface Science</i>. 2001;175-176:769-776. doi:<a href="https://doi.org/10.1016/s0169-4332(01)00114-3">10.1016/s0169-4332(01)00114-3</a> K. Hingerl, R. E. Balderas-Navarro, A. Bonanni, P. Tichopadek, and W. G. Schmidt, “On the origin of resonance features in reflectance difference data of silicon,” <i>Applied Surface Science</i>, vol. 175–176, pp. 769–776, 2001, doi: <a href="https://doi.org/10.1016/s0169-4332(01)00114-3">10.1016/s0169-4332(01)00114-3</a>. Hingerl, K, R.E Balderas-Navarro, A Bonanni, P Tichopadek, and Wolf Gero Schmidt. “On the Origin of Resonance Features in Reflectance Difference Data of Silicon.” <i>Applied Surface Science</i> 175–176 (2001): 769–76. <a href="https://doi.org/10.1016/s0169-4332(01)00114-3">https://doi.org/10.1016/s0169-4332(01)00114-3</a>. 138472019-10-15T09:32:03Z2025-12-16T07:35:41Z