{"doi":"10.1515/teme-2015-0116","page":"219-224","publication":"Technisches Messen","type":"journal_article","date_updated":"2023-06-27T11:02:42Z","language":[{"iso":"eng"}],"issue":"4","department":[{"_id":"49"}],"title":"Erweiterung des Raman-Nath-Modells zur Analyse von Schlierenabbildungen","_id":"13863","volume":83,"citation":{"apa":"Olfert, S., & Henning, B. (2016). Erweiterung des Raman-Nath-Modells zur Analyse von Schlierenabbildungen. Technisches Messen, 83(4), 219–224. https://doi.org/10.1515/teme-2015-0116","mla":"Olfert, Sergei, and Bernd Henning. “Erweiterung Des Raman-Nath-Modells Zur Analyse von Schlierenabbildungen.” Technisches Messen, vol. 83, no. 4, 2016, pp. 219–24, doi:10.1515/teme-2015-0116.","ama":"Olfert S, Henning B. Erweiterung des Raman-Nath-Modells zur Analyse von Schlierenabbildungen. Technisches Messen. 2016;83(4):219-224. doi:10.1515/teme-2015-0116","ieee":"S. Olfert and B. Henning, “Erweiterung des Raman-Nath-Modells zur Analyse von Schlierenabbildungen,” Technisches Messen, vol. 83, no. 4, pp. 219–224, 2016, doi: 10.1515/teme-2015-0116.","short":"S. Olfert, B. Henning, Technisches Messen 83 (2016) 219–224.","chicago":"Olfert, Sergei, and Bernd Henning. “Erweiterung Des Raman-Nath-Modells Zur Analyse von Schlierenabbildungen.” Technisches Messen 83, no. 4 (2016): 219–24. https://doi.org/10.1515/teme-2015-0116.","bibtex":"@article{Olfert_Henning_2016, title={Erweiterung des Raman-Nath-Modells zur Analyse von Schlierenabbildungen}, volume={83}, DOI={10.1515/teme-2015-0116}, number={4}, journal={Technisches Messen}, author={Olfert, Sergei and Henning, Bernd}, year={2016}, pages={219–224} }"},"user_id":"15911","date_created":"2019-10-15T11:01:38Z","intvolume":" 83","status":"public","year":"2016","author":[{"first_name":"Sergei","last_name":"Olfert","full_name":"Olfert, Sergei"},{"full_name":"Henning, Bernd","id":"213","last_name":"Henning","first_name":"Bernd"}]}