{"conference":{"name":"11. Internationaler Kongress für Optische Technologien in Sensorik und Messtechnik (OPTO 2013)","location":"Nürnberg","start_date":"14.05.2013","end_date":"16.05.2013"},"type":"conference","date_updated":"2022-01-06T06:51:46Z","doi":"10.5162/OPTO2013/O3.2","language":[{"iso":"eng"}],"citation":{"bibtex":"@inproceedings{Hoof_Wetzlar_Henning_2013, title={3.2 - Infrared reflectance measurements of thin films with time variable surface roughness or texture}, DOI={<a href=\"https://doi.org/10.5162/OPTO2013/O3.2\">10.5162/OPTO2013/O3.2</a>}, publisher={LibreCat University}, author={Hoof, C.  and Wetzlar, D.  and Henning, Bernd}, year={2013} }","chicago":"Hoof, C. , D.  Wetzlar, and Bernd Henning. “3.2 - Infrared Reflectance Measurements of Thin Films with Time Variable Surface Roughness or Texture.” LibreCat University, 2013. <a href=\"https://doi.org/10.5162/OPTO2013/O3.2\">https://doi.org/10.5162/OPTO2013/O3.2</a>.","short":"C. Hoof, D. Wetzlar, B. Henning, in: LibreCat University, 2013.","ieee":"C. Hoof, D. Wetzlar, and B. Henning, “3.2 - Infrared reflectance measurements of thin films with time variable surface roughness or texture,” presented at the 11. Internationaler Kongress für Optische Technologien in Sensorik und Messtechnik (OPTO 2013), Nürnberg, 2013.","mla":"Hoof, C., et al. <i>3.2 - Infrared Reflectance Measurements of Thin Films with Time Variable Surface Roughness or Texture</i>. LibreCat University, 2013, doi:<a href=\"https://doi.org/10.5162/OPTO2013/O3.2\">10.5162/OPTO2013/O3.2</a>.","ama":"Hoof C, Wetzlar D, Henning B. 3.2 - Infrared reflectance measurements of thin films with time variable surface roughness or texture. In: LibreCat University; 2013. doi:<a href=\"https://doi.org/10.5162/OPTO2013/O3.2\">10.5162/OPTO2013/O3.2</a>","apa":"Hoof, C., Wetzlar, D., &#38; Henning, B. (2013). 3.2 - Infrared reflectance measurements of thin films with time variable surface roughness or texture. Presented at the 11. Internationaler Kongress für Optische Technologien in Sensorik und Messtechnik (OPTO 2013), Nürnberg: LibreCat University. <a href=\"https://doi.org/10.5162/OPTO2013/O3.2\">https://doi.org/10.5162/OPTO2013/O3.2</a>"},"user_id":"15911","date_created":"2019-10-16T13:57:04Z","department":[{"_id":"49"}],"title":"3.2 - Infrared reflectance measurements of thin films with time variable surface roughness or texture","_id":"13880","author":[{"last_name":"Hoof","full_name":"Hoof, C. ","first_name":"C. "},{"last_name":"Wetzlar","full_name":"Wetzlar, D. ","first_name":"D. "},{"full_name":"Henning, Bernd","last_name":"Henning","id":"213","first_name":"Bernd"}],"publisher":"LibreCat University","status":"public","year":"2013"}