{"publication":"Journal of Electronic Measurement and Instrument ","date_updated":"2022-01-06T06:51:49Z","type":"newspaper_article","language":[{"iso":"eng"}],"department":[{"_id":"49"}],"_id":"14012","title":"Ultrasonic Nondestructive Testing of composite materials using disturbed coincidence conditions","date_created":"2019-10-25T12:48:38Z","citation":{"mla":"Bause, Fabian, et al. “Ultrasonic Nondestructive Testing of Composite Materials Using Disturbed Coincidence Conditions.” <i>Journal of Electronic Measurement and Instrument </i>, 2011.","ama":"Bause F, Olfert S, Schröder A, Rautenberg J, Henning B, Moritzer E. Ultrasonic Nondestructive Testing of composite materials using disturbed coincidence conditions. <i>Journal of Electronic Measurement and Instrument </i>. 2011.","ieee":"F. Bause, S. Olfert, A. Schröder, J. Rautenberg, B. Henning, and E. Moritzer, “Ultrasonic Nondestructive Testing of composite materials using disturbed coincidence conditions,” <i>Journal of Electronic Measurement and Instrument </i>, 2011.","apa":"Bause, F., Olfert, S., Schröder, A., Rautenberg, J., Henning, B., &#38; Moritzer, E. (2011). Ultrasonic Nondestructive Testing of composite materials using disturbed coincidence conditions. <i>Journal of Electronic Measurement and Instrument </i>.","bibtex":"@article{Bause_Olfert_Schröder_Rautenberg_Henning_Moritzer_2011, title={Ultrasonic Nondestructive Testing of composite materials using disturbed coincidence conditions}, journal={Journal of Electronic Measurement and Instrument }, author={Bause, Fabian and Olfert, Sergei and Schröder, Andreas and Rautenberg, Jens and Henning, Bernd and Moritzer, Elmar}, year={2011} }","short":"F. Bause, S. Olfert, A. Schröder, J. Rautenberg, B. Henning, E. Moritzer, Journal of Electronic Measurement and Instrument  (2011).","chicago":"Bause, Fabian, Sergei Olfert, Andreas Schröder, Jens Rautenberg, Bernd Henning, and Elmar Moritzer. “Ultrasonic Nondestructive Testing of Composite Materials Using Disturbed Coincidence Conditions.” <i>Journal of Electronic Measurement and Instrument </i>, 2011."},"user_id":"15911","publication_date":"2011","year":"2011","status":"public","author":[{"last_name":"Bause","full_name":"Bause, Fabian","first_name":"Fabian"},{"first_name":"Sergei","full_name":"Olfert, Sergei","last_name":"Olfert"},{"full_name":"Schröder, Andreas","last_name":"Schröder","first_name":"Andreas"},{"last_name":"Rautenberg","full_name":"Rautenberg, Jens","first_name":"Jens"},{"first_name":"Bernd","full_name":"Henning, Bernd","id":"213","last_name":"Henning"},{"first_name":"Elmar","last_name":"Moritzer","full_name":"Moritzer, Elmar"}]}