{"type":"conference","date_created":"2019-11-22T09:21:57Z","date_updated":"2022-01-06T06:52:16Z","author":[{"last_name":"Böttcher","first_name":"Stefan","full_name":"Böttcher, Stefan","id":"624"},{"last_name":"Steinmetz","full_name":"Steinmetz, Rita","id":"14961","first_name":"Rita"}],"publication_identifier":{"isbn":["0769525717"]},"status":"public","title":"Finding the Leak: A Privacy Audit System for Sensitive XML Databases","publisher":"IEEE","language":[{"iso":"eng"}],"doi":"10.1109/icdew.2006.61","department":[{"_id":"69"}],"user_id":"14961","citation":{"ieee":"S. Böttcher and R. Steinmetz, “Finding the Leak: A Privacy Audit System for Sensitive XML Databases,” in 22nd International Conference on Data Engineering Workshops (ICDEW’06), 2006.","mla":"Böttcher, Stefan, and Rita Steinmetz. “Finding the Leak: A Privacy Audit System for Sensitive XML Databases.” 22nd International Conference on Data Engineering Workshops (ICDEW’06), IEEE, 2006, doi:10.1109/icdew.2006.61.","apa":"Böttcher, S., & Steinmetz, R. (2006). Finding the Leak: A Privacy Audit System for Sensitive XML Databases. In 22nd International Conference on Data Engineering Workshops (ICDEW’06). IEEE. https://doi.org/10.1109/icdew.2006.61","ama":"Böttcher S, Steinmetz R. Finding the Leak: A Privacy Audit System for Sensitive XML Databases. In: 22nd International Conference on Data Engineering Workshops (ICDEW’06). IEEE; 2006. doi:10.1109/icdew.2006.61","short":"S. Böttcher, R. Steinmetz, in: 22nd International Conference on Data Engineering Workshops (ICDEW’06), IEEE, 2006.","chicago":"Böttcher, Stefan, and Rita Steinmetz. “Finding the Leak: A Privacy Audit System for Sensitive XML Databases.” In 22nd International Conference on Data Engineering Workshops (ICDEW’06). IEEE, 2006. https://doi.org/10.1109/icdew.2006.61.","bibtex":"@inproceedings{Böttcher_Steinmetz_2006, title={Finding the Leak: A Privacy Audit System for Sensitive XML Databases}, DOI={10.1109/icdew.2006.61}, booktitle={22nd International Conference on Data Engineering Workshops (ICDEW’06)}, publisher={IEEE}, author={Böttcher, Stefan and Steinmetz, Rita}, year={2006} }"},"_id":"15151","year":"2006","publication":"22nd International Conference on Data Engineering Workshops (ICDEW'06)","publication_status":"published"}