{"_id":"15419","date_updated":"2022-04-04T12:30:02Z","year":"2020","place":"Ludwigsburg","title":"Dynamic Multi-Frequency Test Method for Hidden Interconnect Defects","type":"misc","date_created":"2019-12-29T16:13:58Z","page":"4","department":[{"_id":"48"}],"publication_status":"published","status":"public","citation":{"bibtex":"@book{Sadeghi-Kohan_Hellebrand_2020, place={Ludwigsburg}, title={Dynamic Multi-Frequency Test Method for Hidden Interconnect Defects}, publisher={32. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’20), 16. - 18. Februar 2020}, author={Sadeghi-Kohan, Somayeh and Hellebrand, Sybille}, year={2020} }","short":"S. Sadeghi-Kohan, S. Hellebrand, Dynamic Multi-Frequency Test Method for Hidden Interconnect Defects, 32. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’20), 16. - 18. Februar 2020, Ludwigsburg, 2020.","apa":"Sadeghi-Kohan, S., &#38; Hellebrand, S. (2020). <i>Dynamic Multi-Frequency Test Method for Hidden Interconnect Defects</i>. 32. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’20), 16. - 18. Februar 2020.","chicago":"Sadeghi-Kohan, Somayeh, and Sybille Hellebrand. <i>Dynamic Multi-Frequency Test Method for Hidden Interconnect Defects</i>. Ludwigsburg: 32. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’20), 16. - 18. Februar 2020, 2020.","mla":"Sadeghi-Kohan, Somayeh, and Sybille Hellebrand. <i>Dynamic Multi-Frequency Test Method for Hidden Interconnect Defects</i>. 32. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’20), 16. - 18. Februar 2020, 2020.","ama":"Sadeghi-Kohan S, Hellebrand S. <i>Dynamic Multi-Frequency Test Method for Hidden Interconnect Defects</i>. 32. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’20), 16. - 18. Februar 2020; 2020.","ieee":"S. Sadeghi-Kohan and S. Hellebrand, <i>Dynamic Multi-Frequency Test Method for Hidden Interconnect Defects</i>. Ludwigsburg: 32. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’20), 16. - 18. Februar 2020, 2020."},"author":[{"last_name":"Sadeghi-Kohan","first_name":"Somayeh","id":"78614","full_name":"Sadeghi-Kohan, Somayeh"},{"first_name":"Sybille","last_name":"Hellebrand","full_name":"Hellebrand, Sybille","orcid":"0000-0002-3717-3939","id":"209"}],"language":[{"iso":"eng"}],"user_id":"209","publisher":"32. Workshop \"Testmethoden und Zuverlässigkeit von Schaltungen und Systemen\" (TuZ'20), 16. - 18. Februar 2020","keyword":["WORKSHOP"]}