{"language":[{"iso":"eng"}],"conference":{"location":"Seoul","name":"1st IEEE/ACM International Conference on Automation of Software Test (AST 2020)"},"user_id":"8447","date_updated":"2022-01-06T06:52:47Z","type":"conference","status":"public","_id":"16274","publisher":"ACM","publication":"Proceedings of the 1st IEEE/ACM International Conference on Automation of Software Test AST","citation":{"ieee":"I. Jovanovikj, A. Nagaraj, E. Yigitbas, A. Anjorin, S. Sauer, and G. Engels, “Validating Test Case Migration via Mutation Analysis ,” in <i>Proceedings of the 1st IEEE/ACM International Conference on Automation of Software Test AST</i>, Seoul, 2020, pp. 31–40.","short":"I. Jovanovikj, A. Nagaraj, E. Yigitbas, A. Anjorin, S. Sauer, G. Engels, in: Proceedings of the 1st IEEE/ACM International Conference on Automation of Software Test AST, ACM, 2020, pp. 31–40.","chicago":"Jovanovikj, Ivan, Achyuth Nagaraj, Enes Yigitbas, Anthony Anjorin, Stefan Sauer, and Gregor Engels. “Validating Test Case Migration via Mutation Analysis .” In <i>Proceedings of the 1st IEEE/ACM International Conference on Automation of Software Test AST</i>, 31–40. ACM, 2020.","bibtex":"@inproceedings{Jovanovikj_Nagaraj_Yigitbas_Anjorin_Sauer_Engels_2020, title={Validating Test Case Migration via Mutation Analysis }, booktitle={Proceedings of the 1st IEEE/ACM International Conference on Automation of Software Test AST}, publisher={ACM}, author={Jovanovikj, Ivan and Nagaraj, Achyuth and Yigitbas, Enes and Anjorin, Anthony and Sauer, Stefan and Engels, Gregor}, year={2020}, pages={31–40} }","apa":"Jovanovikj, I., Nagaraj, A., Yigitbas, E., Anjorin, A., Sauer, S., &#38; Engels, G. (2020). Validating Test Case Migration via Mutation Analysis . In <i>Proceedings of the 1st IEEE/ACM International Conference on Automation of Software Test AST</i> (pp. 31–40). Seoul: ACM.","mla":"Jovanovikj, Ivan, et al. “Validating Test Case Migration via Mutation Analysis .” <i>Proceedings of the 1st IEEE/ACM International Conference on Automation of Software Test AST</i>, ACM, 2020, pp. 31–40.","ama":"Jovanovikj I, Nagaraj A, Yigitbas E, Anjorin A, Sauer S, Engels G. Validating Test Case Migration via Mutation Analysis . In: <i>Proceedings of the 1st IEEE/ACM International Conference on Automation of Software Test AST</i>. ACM; 2020:31-40."},"author":[{"full_name":"Jovanovikj, Ivan","orcid":"https://orcid.org/0000-0002-1838-794X","last_name":"Jovanovikj","first_name":"Ivan","id":"39187"},{"full_name":"Nagaraj, Achyuth","last_name":"Nagaraj","first_name":"Achyuth"},{"id":"8447","first_name":"Enes","last_name":"Yigitbas","orcid":"0000-0002-5967-833X","full_name":"Yigitbas, Enes"},{"last_name":"Anjorin","first_name":"Anthony","full_name":"Anjorin, Anthony"},{"full_name":"Sauer, Stefan","last_name":"Sauer","first_name":"Stefan","id":"447"},{"last_name":"Engels","id":"107","first_name":"Gregor","full_name":"Engels, Gregor"}],"department":[{"_id":"66"},{"_id":"534"}],"title":"Validating Test Case Migration via Mutation Analysis ","date_created":"2020-03-09T13:11:25Z","year":"2020","page":"31-40"}