---
_id: '16274'
author:
- first_name: Ivan
  full_name: Jovanovikj, Ivan
  id: '39187'
  last_name: Jovanovikj
  orcid: https://orcid.org/0000-0002-1838-794X
- first_name: Achyuth
  full_name: Nagaraj, Achyuth
  last_name: Nagaraj
- first_name: Enes
  full_name: Yigitbas, Enes
  id: '8447'
  last_name: Yigitbas
  orcid: 0000-0002-5967-833X
- first_name: Anthony
  full_name: Anjorin, Anthony
  last_name: Anjorin
- first_name: Stefan
  full_name: Sauer, Stefan
  id: '447'
  last_name: Sauer
- first_name: Gregor
  full_name: Engels, Gregor
  id: '107'
  last_name: Engels
citation:
  ama: 'Jovanovikj I, Nagaraj A, Yigitbas E, Anjorin A, Sauer S, Engels G. Validating
    Test Case Migration via Mutation Analysis . In: <i>Proceedings of the 1st IEEE/ACM
    International Conference on Automation of Software Test AST</i>. ACM; 2020:31-40.'
  apa: 'Jovanovikj, I., Nagaraj, A., Yigitbas, E., Anjorin, A., Sauer, S., &#38; Engels,
    G. (2020). Validating Test Case Migration via Mutation Analysis . In <i>Proceedings
    of the 1st IEEE/ACM International Conference on Automation of Software Test AST</i>
    (pp. 31–40). Seoul: ACM.'
  bibtex: '@inproceedings{Jovanovikj_Nagaraj_Yigitbas_Anjorin_Sauer_Engels_2020, title={Validating
    Test Case Migration via Mutation Analysis }, booktitle={Proceedings of the 1st
    IEEE/ACM International Conference on Automation of Software Test AST}, publisher={ACM},
    author={Jovanovikj, Ivan and Nagaraj, Achyuth and Yigitbas, Enes and Anjorin,
    Anthony and Sauer, Stefan and Engels, Gregor}, year={2020}, pages={31–40} }'
  chicago: Jovanovikj, Ivan, Achyuth Nagaraj, Enes Yigitbas, Anthony Anjorin, Stefan
    Sauer, and Gregor Engels. “Validating Test Case Migration via Mutation Analysis
    .” In <i>Proceedings of the 1st IEEE/ACM International Conference on Automation
    of Software Test AST</i>, 31–40. ACM, 2020.
  ieee: I. Jovanovikj, A. Nagaraj, E. Yigitbas, A. Anjorin, S. Sauer, and G. Engels,
    “Validating Test Case Migration via Mutation Analysis ,” in <i>Proceedings of
    the 1st IEEE/ACM International Conference on Automation of Software Test AST</i>,
    Seoul, 2020, pp. 31–40.
  mla: Jovanovikj, Ivan, et al. “Validating Test Case Migration via Mutation Analysis
    .” <i>Proceedings of the 1st IEEE/ACM International Conference on Automation of
    Software Test AST</i>, ACM, 2020, pp. 31–40.
  short: 'I. Jovanovikj, A. Nagaraj, E. Yigitbas, A. Anjorin, S. Sauer, G. Engels,
    in: Proceedings of the 1st IEEE/ACM International Conference on Automation of
    Software Test AST, ACM, 2020, pp. 31–40.'
conference:
  location: Seoul
  name: 1st IEEE/ACM International Conference on Automation of Software Test (AST
    2020)
date_created: 2020-03-09T13:11:25Z
date_updated: 2022-01-06T06:52:47Z
department:
- _id: '66'
- _id: '534'
language:
- iso: eng
page: 31-40
publication: Proceedings of the 1st IEEE/ACM International Conference on Automation
  of Software Test AST
publisher: ACM
status: public
title: 'Validating Test Case Migration via Mutation Analysis '
type: conference
user_id: '8447'
year: '2020'
...