{"year":"2020","place":"Virtual Conference - Originally Washington, DC, USA","status":"public","author":[{"first_name":"Stefan","last_name":"Holst","full_name":"Holst, Stefan"},{"last_name":"Kampmann","id":"10935","full_name":"Kampmann, Matthias","first_name":"Matthias"},{"id":"22707","last_name":"Sprenger","full_name":"Sprenger, Alexander","first_name":"Alexander"},{"first_name":"Jan Dennis","last_name":"Reimer","id":"36703","full_name":"Reimer, Jan Dennis"},{"orcid":"0000-0002-3717-3939","first_name":"Sybille","last_name":"Hellebrand","id":"209","full_name":"Hellebrand, Sybille"},{"last_name":"Wunderlich","full_name":"Wunderlich, Hans-Joachim","first_name":"Hans-Joachim"},{"last_name":"Weng","full_name":"Weng, Xiaoqing","first_name":"Xiaoqing"}],"_id":"19421","title":"Logic Fault Diagnosis of Hidden Delay Defects","department":[{"_id":"48"}],"date_created":"2020-09-15T13:56:08Z","user_id":"209","citation":{"short":"S. Holst, M. Kampmann, A. Sprenger, J.D. Reimer, S. Hellebrand, H.-J. Wunderlich, X. Weng, in: IEEE International Test Conference (ITC’20), November 2020, Virtual Conference - Originally Washington, DC, USA, 2020.","chicago":"Holst, Stefan, Matthias Kampmann, Alexander Sprenger, Jan Dennis Reimer, Sybille Hellebrand, Hans-Joachim Wunderlich, and Xiaoqing Weng. “Logic Fault Diagnosis of Hidden Delay Defects.” In <i>IEEE International Test Conference (ITC’20), November 2020</i>. Virtual Conference - Originally Washington, DC, USA, 2020.","bibtex":"@inproceedings{Holst_Kampmann_Sprenger_Reimer_Hellebrand_Wunderlich_Weng_2020, place={Virtual Conference - Originally Washington, DC, USA}, title={Logic Fault Diagnosis of Hidden Delay Defects}, booktitle={IEEE International Test Conference (ITC’20), November 2020}, author={Holst, Stefan and Kampmann, Matthias and Sprenger, Alexander and Reimer, Jan Dennis and Hellebrand, Sybille and Wunderlich, Hans-Joachim and Weng, Xiaoqing}, year={2020} }","apa":"Holst, S., Kampmann, M., Sprenger, A., Reimer, J. D., Hellebrand, S., Wunderlich, H.-J., &#38; Weng, X. (2020). Logic Fault Diagnosis of Hidden Delay Defects. <i>IEEE International Test Conference (ITC’20), November 2020</i>.","mla":"Holst, Stefan, et al. “Logic Fault Diagnosis of Hidden Delay Defects.” <i>IEEE International Test Conference (ITC’20), November 2020</i>, 2020.","ama":"Holst S, Kampmann M, Sprenger A, et al. Logic Fault Diagnosis of Hidden Delay Defects. In: <i>IEEE International Test Conference (ITC’20), November 2020</i>. ; 2020.","ieee":"S. Holst <i>et al.</i>, “Logic Fault Diagnosis of Hidden Delay Defects,” 2020."},"language":[{"iso":"eng"}],"publication_status":"published","type":"conference","date_updated":"2022-05-11T17:08:20Z","publication":"IEEE International Test Conference (ITC'20), November 2020"}