{"department":[{"_id":"7"},{"_id":"77"}],"title":"Automatic Fairness Testing of Machine Learning Models","_id":"19656","citation":{"bibtex":"@inproceedings{Sharma_Wehrheim, series={LNCS}, title={Automatic Fairness Testing of Machine Learning Models}, booktitle={Proceedings of the 32th IFIP International Conference on Testing Software and Systems (ICTSS)}, publisher={Springer}, author={Sharma, Arnab and Wehrheim, Heike}, collection={LNCS} }","chicago":"Sharma, Arnab, and Heike Wehrheim. “Automatic Fairness Testing of Machine Learning Models.” In <i>Proceedings of the 32th IFIP International Conference on Testing Software and Systems (ICTSS)</i>. LNCS. Springer, n.d.","short":"A. Sharma, H. Wehrheim, in: Proceedings of the 32th IFIP International Conference on Testing Software and Systems (ICTSS), Springer, n.d.","ama":"Sharma A, Wehrheim H. Automatic Fairness Testing of Machine Learning Models. In: <i>Proceedings of the 32th IFIP International Conference on Testing Software and Systems (ICTSS)</i>. LNCS. Springer.","mla":"Sharma, Arnab, and Heike Wehrheim. “Automatic Fairness Testing of Machine Learning Models.” <i>Proceedings of the 32th IFIP International Conference on Testing Software and Systems (ICTSS)</i>, Springer.","ieee":"A. Sharma and H. Wehrheim, “Automatic Fairness Testing of Machine Learning Models,” in <i>Proceedings of the 32th IFIP International Conference on Testing Software and Systems (ICTSS)</i>.","apa":"Sharma, A., &#38; Wehrheim, H. (n.d.). Automatic Fairness Testing of Machine Learning Models. In <i>Proceedings of the 32th IFIP International Conference on Testing Software and Systems (ICTSS)</i>. Springer."},"user_id":"477","date_created":"2020-09-24T12:53:02Z","project":[{"name":"SFB 901","_id":"1"},{"_id":"11","name":"SFB 901 - Subproject B3"},{"_id":"3","name":"SFB 901 - Project Area B"}],"status":"public","year":"2020","author":[{"first_name":"Arnab","full_name":"Sharma, Arnab","id":"67200","last_name":"Sharma"},{"first_name":"Heike","id":"573","last_name":"Wehrheim","full_name":"Wehrheim, Heike"}],"publisher":"Springer","series_title":"LNCS","publication":"Proceedings of the 32th IFIP International Conference on Testing Software and Systems (ICTSS)","type":"conference","date_updated":"2022-01-06T06:54:09Z","language":[{"iso":"eng"}],"publication_status":"accepted"}