{"project":[{"name":"SFB 901","_id":"1"},{"name":"SFB 901 - Subproject B3","_id":"11"},{"_id":"3","name":"SFB 901 - Project Area B"}],"date_updated":"2022-01-06T06:54:09Z","type":"conference","year":"2020","date_created":"2020-09-24T12:53:02Z","language":[{"iso":"eng"}],"user_id":"477","_id":"19656","status":"public","citation":{"ieee":"A. Sharma and H. Wehrheim, “Automatic Fairness Testing of Machine Learning Models,” in <i>Proceedings of the 32th IFIP International Conference on Testing Software and Systems (ICTSS)</i>.","chicago":"Sharma, Arnab, and Heike Wehrheim. “Automatic Fairness Testing of Machine Learning Models.” In <i>Proceedings of the 32th IFIP International Conference on Testing Software and Systems (ICTSS)</i>. LNCS. Springer, n.d.","ama":"Sharma A, Wehrheim H. Automatic Fairness Testing of Machine Learning Models. In: <i>Proceedings of the 32th IFIP International Conference on Testing Software and Systems (ICTSS)</i>. LNCS. Springer.","bibtex":"@inproceedings{Sharma_Wehrheim, series={LNCS}, title={Automatic Fairness Testing of Machine Learning Models}, booktitle={Proceedings of the 32th IFIP International Conference on Testing Software and Systems (ICTSS)}, publisher={Springer}, author={Sharma, Arnab and Wehrheim, Heike}, collection={LNCS} }","short":"A. Sharma, H. Wehrheim, in: Proceedings of the 32th IFIP International Conference on Testing Software and Systems (ICTSS), Springer, n.d.","apa":"Sharma, A., &#38; Wehrheim, H. (n.d.). Automatic Fairness Testing of Machine Learning Models. In <i>Proceedings of the 32th IFIP International Conference on Testing Software and Systems (ICTSS)</i>. Springer.","mla":"Sharma, Arnab, and Heike Wehrheim. “Automatic Fairness Testing of Machine Learning Models.” <i>Proceedings of the 32th IFIP International Conference on Testing Software and Systems (ICTSS)</i>, Springer."},"title":"Automatic Fairness Testing of Machine Learning Models","author":[{"last_name":"Sharma","full_name":"Sharma, Arnab","id":"67200","first_name":"Arnab"},{"full_name":"Wehrheim, Heike","id":"573","last_name":"Wehrheim","first_name":"Heike"}],"series_title":"LNCS","department":[{"_id":"7"},{"_id":"77"}],"publication":"Proceedings of the 32th IFIP International Conference on Testing Software and Systems (ICTSS)","publication_status":"accepted","publisher":"Springer"}