{"date_created":"2020-11-13T08:34:51Z","user_id":"14931","citation":{"ama":"Pasic F, Wohlers B, Dziwok S, Becker M, Heinrich M. A KPI-based Condition Monitoring System for the Beer Brewing Process. In: <i>2019 24th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA)</i>. ; 2019:1469-1472.","mla":"Pasic, Faruk, et al. “A KPI-Based Condition Monitoring System for the Beer Brewing Process.” <i>2019 24th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA)</i>, 2019, pp. 1469–72.","ieee":"F. Pasic, B. Wohlers, S. Dziwok, M. Becker, and M. Heinrich, “A KPI-based Condition Monitoring System for the Beer Brewing Process,” in <i>2019 24th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA)</i>, 2019, pp. 1469–1472.","apa":"Pasic, F., Wohlers, B., Dziwok, S., Becker, M., &#38; Heinrich, M. (2019). A KPI-based Condition Monitoring System for the Beer Brewing Process. <i>2019 24th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA)</i>, 1469–1472.","bibtex":"@inproceedings{Pasic_Wohlers_Dziwok_Becker_Heinrich_2019, title={A KPI-based Condition Monitoring System for the Beer Brewing Process}, booktitle={2019 24th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA)}, author={Pasic, Faruk and Wohlers, Benedict and Dziwok, Stefan and Becker, Matthias and Heinrich, Matthias}, year={2019}, pages={1469–1472} }","short":"F. Pasic, B. Wohlers, S. Dziwok, M. Becker, M. Heinrich, in: 2019 24th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA), 2019, pp. 1469–1472.","chicago":"Pasic, Faruk, Benedict Wohlers, Stefan Dziwok, Matthias Becker, and Matthias Heinrich. “A KPI-Based Condition Monitoring System for the Beer Brewing Process.” In <i>2019 24th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA)</i>, 1469–72, 2019."},"title":"A KPI-based Condition Monitoring System for the Beer Brewing Process","_id":"20347","department":[{"_id":"241"}],"author":[{"full_name":"Pasic, Faruk","last_name":"Pasic","id":"49576","first_name":"Faruk"},{"full_name":"Wohlers, Benedict","id":"53786","last_name":"Wohlers","first_name":"Benedict"},{"orcid":"http://orcid.org/0000-0002-8679-6673","first_name":"Stefan","full_name":"Dziwok, Stefan","last_name":"Dziwok","id":"3901"},{"first_name":"Matthias","orcid":"https://orcid.org/0000-0003-2465-9347","last_name":"Becker","id":"4870","full_name":"Becker, Matthias"},{"full_name":"Heinrich, Matthias","last_name":"Heinrich","first_name":"Matthias"}],"year":"2019","status":"public","type":"conference","date_updated":"2022-01-06T06:54:26Z","publication":"2019 24th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA)","page":"1469-1472","language":[{"iso":"eng"}]}