{"user_id":"5786","date_created":"2020-11-26T08:47:56Z","status":"public","year":"2020","author":[{"full_name":"Benz, Manuel","last_name":"Benz","first_name":"Manuel"},{"first_name":"Erik","last_name":"Krogh Kristensen","full_name":"Krogh Kristensen, Erik"},{"first_name":"Linghui","last_name":"Luo","full_name":"Luo, Linghui"},{"first_name":"Nataniel","last_name":"P. Borges Jr.","full_name":"P. Borges Jr., Nataniel"},{"id":"59256","orcid":"0000-0003-3470-3647","first_name":"Eric","full_name":"Bodden, Eric","last_name":"Bodden"},{"first_name":"Andreas","last_name":"Zeller","full_name":"Zeller, Andreas"}],"publication":"International Conference for Software Engineering (ICSE)","_id":"20510","title":"Heaps'n Leaks: How Heap Snapshots Improve Android Taint Analysis","type":"conference","citation":{"ieee":"M. Benz, E. Krogh Kristensen, L. Luo, N. P. Borges Jr., E. Bodden, and A. Zeller, “Heaps’n Leaks: How Heap Snapshots Improve Android Taint Analysis,” 2020.","chicago":"Benz, Manuel, Erik Krogh Kristensen, Linghui Luo, Nataniel P. Borges Jr., Eric Bodden, and Andreas Zeller. “Heaps’n Leaks: How Heap Snapshots Improve Android Taint Analysis.” In <i>International Conference for Software Engineering (ICSE)</i>, 2020.","ama":"Benz M, Krogh Kristensen E, Luo L, P. Borges Jr. N, Bodden E, Zeller A. Heaps’n Leaks: How Heap Snapshots Improve Android Taint Analysis. In: <i>International Conference for Software Engineering (ICSE)</i>. ; 2020.","bibtex":"@inproceedings{Benz_Krogh Kristensen_Luo_P. Borges Jr._Bodden_Zeller_2020, title={Heaps’n Leaks: How Heap Snapshots Improve Android Taint Analysis}, booktitle={International Conference for Software Engineering (ICSE)}, author={Benz, Manuel and Krogh Kristensen, Erik and Luo, Linghui and P. Borges Jr., Nataniel and Bodden, Eric and Zeller, Andreas}, year={2020} }","short":"M. Benz, E. Krogh Kristensen, L. Luo, N. P. Borges Jr., E. Bodden, A. Zeller, in: International Conference for Software Engineering (ICSE), 2020.","apa":"Benz, M., Krogh Kristensen, E., Luo, L., P. Borges Jr., N., Bodden, E., &#38; Zeller, A. (2020). Heaps’n Leaks: How Heap Snapshots Improve Android Taint Analysis. <i>International Conference for Software Engineering (ICSE)</i>.","mla":"Benz, Manuel, et al. “Heaps’n Leaks: How Heap Snapshots Improve Android Taint Analysis.” <i>International Conference for Software Engineering (ICSE)</i>, 2020."},"date_updated":"2022-01-06T06:54:29Z","department":[{"_id":"76"}],"language":[{"iso":"eng"}]}