{"language":[{"iso":"eng"}],"date_updated":"2022-01-06T06:54:29Z","type":"conference_editor","year":"2018","status":"public","publisher":"ACM","department":[{"_id":"76"}],"title":"Proceedings of the 27th ACM SIGSOFT International Symposium on Software Testing and Analysis, ISSTA 2018, Amsterdam, The Netherlands, July 16-21, 2018","_id":"20545","editor":[{"first_name":"Frank","full_name":"Tip, Frank","last_name":"Tip"},{"last_name":"Bodden","full_name":"Bodden, Eric","first_name":"Eric"}],"date_created":"2020-11-30T09:35:03Z","citation":{"ieee":"F. Tip and E. Bodden, Eds., <i>Proceedings of the 27th ACM SIGSOFT International Symposium on Software Testing and Analysis, ISSTA 2018, Amsterdam, The Netherlands, July 16-21, 2018</i>. ACM, 2018.","mla":"Tip, Frank, and Eric Bodden, editors. <i>Proceedings of the 27th ACM SIGSOFT International Symposium on Software Testing and Analysis, ISSTA 2018, Amsterdam, The Netherlands, July 16-21, 2018</i>. ACM, 2018.","ama":"Tip F, Bodden E, eds. <i>Proceedings of the 27th ACM SIGSOFT International Symposium on Software Testing and Analysis, ISSTA 2018, Amsterdam, The Netherlands, July 16-21, 2018</i>. ACM; 2018.","bibtex":"@book{Tip_Bodden_2018, title={Proceedings of the 27th ACM SIGSOFT International Symposium on Software Testing and Analysis, ISSTA 2018, Amsterdam, The Netherlands, July 16-21, 2018}, publisher={ACM}, year={2018} }","apa":"Tip, F., &#38; Bodden, E. (Eds.). (2018). <i>Proceedings of the 27th ACM SIGSOFT International Symposium on Software Testing and Analysis, ISSTA 2018, Amsterdam, The Netherlands, July 16-21, 2018</i>. ACM.","short":"F. Tip, E. Bodden, eds., Proceedings of the 27th ACM SIGSOFT International Symposium on Software Testing and Analysis, ISSTA 2018, Amsterdam, The Netherlands, July 16-21, 2018, ACM, 2018.","chicago":"Tip, Frank, and Eric Bodden, eds. <i>Proceedings of the 27th ACM SIGSOFT International Symposium on Software Testing and Analysis, ISSTA 2018, Amsterdam, The Netherlands, July 16-21, 2018</i>. ACM, 2018."},"user_id":"5786"}