{"date_created":"2020-11-30T11:10:01Z","keyword":["Just-in-Time","Layered analysis","Static analysis"],"page":"307-317","doi":"10.1145/3092703.3092705","author":[{"full_name":"Do, Lisa Nguyen Quang","last_name":"Do","first_name":"Lisa Nguyen Quang"},{"full_name":"Ali, Karim","last_name":"Ali","first_name":"Karim"},{"last_name":"Livshits","full_name":"Livshits, Benjamin","first_name":"Benjamin"},{"id":"59256","last_name":"Bodden","full_name":"Bodden, Eric","first_name":"Eric","orcid":"0000-0003-3470-3647"},{"first_name":"Justin","full_name":"Smith, Justin","last_name":"Smith"},{"first_name":"Emerson","full_name":"Murphy-Hill, Emerson","last_name":"Murphy-Hill"}],"publisher":"ACM","place":"New York, NY, USA","year":"2017","status":"public","citation":{"short":"L.N.Q. Do, K. Ali, B. Livshits, E. Bodden, J. Smith, E. Murphy-Hill, in: Proceedings of the 26th ACM SIGSOFT International Symposium on Software Testing and Analysis, ACM, New York, NY, USA, 2017, pp. 307–317.","chicago":"Do, Lisa Nguyen Quang, Karim Ali, Benjamin Livshits, Eric Bodden, Justin Smith, and Emerson Murphy-Hill. “Just-in-Time Static Analysis.” In <i>Proceedings of the 26th ACM SIGSOFT International Symposium on Software Testing and Analysis</i>, 307–17. ISSTA 2017. New York, NY, USA: ACM, 2017. <a href=\"https://doi.org/10.1145/3092703.3092705\">https://doi.org/10.1145/3092703.3092705</a>.","bibtex":"@inproceedings{Do_Ali_Livshits_Bodden_Smith_Murphy-Hill_2017, place={New York, NY, USA}, series={ISSTA 2017}, title={Just-in-time Static Analysis}, DOI={<a href=\"https://doi.org/10.1145/3092703.3092705\">10.1145/3092703.3092705</a>}, booktitle={Proceedings of the 26th ACM SIGSOFT International Symposium on Software Testing and Analysis}, publisher={ACM}, author={Do, Lisa Nguyen Quang and Ali, Karim and Livshits, Benjamin and Bodden, Eric and Smith, Justin and Murphy-Hill, Emerson}, year={2017}, pages={307–317}, collection={ISSTA 2017} }","apa":"Do, L. N. Q., Ali, K., Livshits, B., Bodden, E., Smith, J., &#38; Murphy-Hill, E. (2017). Just-in-time Static Analysis. <i>Proceedings of the 26th ACM SIGSOFT International Symposium on Software Testing and Analysis</i>, 307–317. <a href=\"https://doi.org/10.1145/3092703.3092705\">https://doi.org/10.1145/3092703.3092705</a>","mla":"Do, Lisa Nguyen Quang, et al. “Just-in-Time Static Analysis.” <i>Proceedings of the 26th ACM SIGSOFT International Symposium on Software Testing and Analysis</i>, ACM, 2017, pp. 307–17, doi:<a href=\"https://doi.org/10.1145/3092703.3092705\">10.1145/3092703.3092705</a>.","ama":"Do LNQ, Ali K, Livshits B, Bodden E, Smith J, Murphy-Hill E. Just-in-time Static Analysis. In: <i>Proceedings of the 26th ACM SIGSOFT International Symposium on Software Testing and Analysis</i>. ISSTA 2017. ACM; 2017:307-317. doi:<a href=\"https://doi.org/10.1145/3092703.3092705\">10.1145/3092703.3092705</a>","ieee":"L. N. Q. Do, K. Ali, B. Livshits, E. Bodden, J. Smith, and E. Murphy-Hill, “Just-in-time Static Analysis,” in <i>Proceedings of the 26th ACM SIGSOFT International Symposium on Software Testing and Analysis</i>, 2017, pp. 307–317, doi: <a href=\"https://doi.org/10.1145/3092703.3092705\">10.1145/3092703.3092705</a>."},"user_id":"5786","department":[{"_id":"76"}],"publication_identifier":{"isbn":["978-1-4503-5076-1"]},"title":"Just-in-time Static Analysis","_id":"20559","main_file_link":[{"url":"http://bodden.de/pubs/nal+17jit.pdf"}],"language":[{"iso":"eng"}],"publication":"Proceedings of the 26th ACM SIGSOFT International Symposium on Software Testing and Analysis","type":"conference","date_updated":"2022-01-06T06:54:30Z","series_title":"ISSTA 2017"}