{"department":[{"_id":"15"},{"_id":"230"}],"publication_identifier":{"issn":["0021-8979","1089-7550"]},"title":"Spatially resolved light field analysis of the second-harmonic signal of χ(2)-materials in the tight focusing regime","_id":"22054","citation":{"bibtex":"@article{Spychala_Mackwitz_Widhalm_Berth_Zrenner_2020, title={Spatially resolved light field analysis of the second-harmonic signal of χ(2)-materials in the tight focusing regime}, DOI={<a href=\"https://doi.org/10.1063/1.5133476\">10.1063/1.5133476</a>}, number={023103}, journal={Journal of Applied Physics}, author={Spychala, K. J. and Mackwitz, P. and Widhalm, A. and Berth, Gerhard and Zrenner, Artur}, year={2020} }","chicago":"Spychala, K. J., P. Mackwitz, A. Widhalm, Gerhard Berth, and Artur Zrenner. “Spatially Resolved Light Field Analysis of the Second-Harmonic Signal of χ(2)-Materials in the Tight Focusing Regime.” <i>Journal of Applied Physics</i>, 2020. <a href=\"https://doi.org/10.1063/1.5133476\">https://doi.org/10.1063/1.5133476</a>.","short":"K.J. Spychala, P. Mackwitz, A. Widhalm, G. Berth, A. Zrenner, Journal of Applied Physics (2020).","ieee":"K. J. Spychala, P. Mackwitz, A. Widhalm, G. Berth, and A. Zrenner, “Spatially resolved light field analysis of the second-harmonic signal of χ(2)-materials in the tight focusing regime,” <i>Journal of Applied Physics</i>, 2020.","mla":"Spychala, K. J., et al. “Spatially Resolved Light Field Analysis of the Second-Harmonic Signal of χ(2)-Materials in the Tight Focusing Regime.” <i>Journal of Applied Physics</i>, 023103, 2020, doi:<a href=\"https://doi.org/10.1063/1.5133476\">10.1063/1.5133476</a>.","ama":"Spychala KJ, Mackwitz P, Widhalm A, Berth G, Zrenner A. Spatially resolved light field analysis of the second-harmonic signal of χ(2)-materials in the tight focusing regime. <i>Journal of Applied Physics</i>. 2020. doi:<a href=\"https://doi.org/10.1063/1.5133476\">10.1063/1.5133476</a>","apa":"Spychala, K. J., Mackwitz, P., Widhalm, A., Berth, G., &#38; Zrenner, A. (2020). Spatially resolved light field analysis of the second-harmonic signal of χ(2)-materials in the tight focusing regime. <i>Journal of Applied Physics</i>. <a href=\"https://doi.org/10.1063/1.5133476\">https://doi.org/10.1063/1.5133476</a>"},"user_id":"606","date_created":"2021-05-09T06:27:56Z","status":"public","year":"2020","author":[{"first_name":"K. J.","last_name":"Spychala","full_name":"Spychala, K. J."},{"full_name":"Mackwitz, P.","last_name":"Mackwitz","first_name":"P."},{"first_name":"A.","full_name":"Widhalm, A.","last_name":"Widhalm"},{"first_name":"Gerhard","full_name":"Berth, Gerhard","last_name":"Berth"},{"orcid":"0000-0002-5190-0944","first_name":"Artur","full_name":"Zrenner, Artur","last_name":"Zrenner","id":"606"}],"doi":"10.1063/1.5133476","article_number":"023103","publication":"Journal of Applied Physics","date_updated":"2022-01-06T06:55:23Z","type":"journal_article","language":[{"iso":"eng"}],"publication_status":"published"}