{"language":[{"iso":"eng"}],"_id":"22280","page":"14595-14604","user_id":"44040","conference":{"end_date":"2021-06-25","start_date":"2021-06-19","name":"IEEE/CVF Conference on Computer Vision and Pattern Recognition, CVPR","location":"Online"},"author":[{"first_name":"Julian","last_name":"Lienen","full_name":"Lienen, Julian","id":"44040"},{"id":"48129","last_name":"Hüllermeier","first_name":"Eyke","full_name":"Hüllermeier, Eyke"},{"first_name":"Ralph","last_name":"Ewerth","full_name":"Ewerth, Ralph"},{"last_name":"Nommensen","first_name":"Nils","full_name":"Nommensen, Nils"}],"status":"public","year":"2021","title":"Monocular Depth Estimation via Listwise Ranking using the Plackett-Luce Model","date_updated":"2022-01-06T06:55:29Z","date_created":"2021-06-02T10:35:40Z","type":"conference","citation":{"mla":"Lienen, Julian, et al. “Monocular Depth Estimation via Listwise Ranking Using the Plackett-Luce Model.” <i>Proceedings of the IEEE/CVF Conference on Computer Vision and Pattern Recognition, CVPR</i>, 2021, pp. 14595–604.","bibtex":"@inproceedings{Lienen_Hüllermeier_Ewerth_Nommensen_2021, title={Monocular Depth Estimation via Listwise Ranking using the Plackett-Luce Model}, booktitle={Proceedings of the IEEE/CVF Conference on Computer Vision and Pattern Recognition, CVPR}, author={Lienen, Julian and Hüllermeier, Eyke and Ewerth, Ralph and Nommensen, Nils}, year={2021}, pages={14595–14604} }","ama":"Lienen J, Hüllermeier E, Ewerth R, Nommensen N. Monocular Depth Estimation via Listwise Ranking using the Plackett-Luce Model. In: <i>Proceedings of the IEEE/CVF Conference on Computer Vision and Pattern Recognition, CVPR</i>. ; 2021:14595-14604.","ieee":"J. Lienen, E. Hüllermeier, R. Ewerth, and N. Nommensen, “Monocular Depth Estimation via Listwise Ranking using the Plackett-Luce Model,” in <i>Proceedings of the IEEE/CVF Conference on Computer Vision and Pattern Recognition, CVPR</i>, Online, 2021, pp. 14595–14604.","apa":"Lienen, J., Hüllermeier, E., Ewerth, R., &#38; Nommensen, N. (2021). Monocular Depth Estimation via Listwise Ranking using the Plackett-Luce Model. <i>Proceedings of the IEEE/CVF Conference on Computer Vision and Pattern Recognition, CVPR</i>, 14595–14604.","short":"J. Lienen, E. Hüllermeier, R. Ewerth, N. Nommensen, in: Proceedings of the IEEE/CVF Conference on Computer Vision and Pattern Recognition, CVPR, 2021, pp. 14595–14604.","chicago":"Lienen, Julian, Eyke Hüllermeier, Ralph Ewerth, and Nils Nommensen. “Monocular Depth Estimation via Listwise Ranking Using the Plackett-Luce Model.” In <i>Proceedings of the IEEE/CVF Conference on Computer Vision and Pattern Recognition, CVPR</i>, 14595–604, 2021."},"publication":"Proceedings of the IEEE/CVF Conference on Computer Vision and Pattern Recognition, CVPR"}