{"language":[{"iso":"eng"}],"date_created":"2021-07-07T08:37:16Z","status":"public","_id":"22537","author":[{"first_name":"C","full_name":"Hoppe, C","last_name":"Hoppe"},{"first_name":"F","last_name":"Mitschker","full_name":"Mitschker, F"},{"first_name":"M","last_name":"Butterling","full_name":"Butterling, M"},{"first_name":"M O","full_name":"Liedke, M O","last_name":"Liedke"},{"full_name":"de los Arcos de Pedro, Maria Teresa","id":"54556","last_name":"de los Arcos de Pedro","first_name":"Maria Teresa"},{"last_name":"Awakowicz","full_name":"Awakowicz, P","first_name":"P"},{"first_name":"A","last_name":"Wagner","full_name":"Wagner, A"},{"id":"194","full_name":"Grundmeier, Guido","last_name":"Grundmeier","first_name":"Guido"}],"type":"journal_article","publication_status":"published","doi":"10.1088/1361-6463/aba8ba","publication":"Journal of Physics D: Applied Physics","department":[{"_id":"302"}],"year":"2020","title":"Characterisation of micropores in plasma deposited SiO x  films by means of positron annihilation lifetime spectroscopy","date_updated":"2023-01-24T08:34:17Z","publication_identifier":{"issn":["0022-3727","1361-6463"]},"citation":{"apa":"Hoppe, C., Mitschker, F., Butterling, M., Liedke, M. O., de los Arcos de Pedro, M. T., Awakowicz, P., Wagner, A., &#38; Grundmeier, G. (2020). Characterisation of micropores in plasma deposited SiO x  films by means of positron annihilation lifetime spectroscopy. <i>Journal of Physics D: Applied Physics</i>, Article 475205. <a href=\"https://doi.org/10.1088/1361-6463/aba8ba\">https://doi.org/10.1088/1361-6463/aba8ba</a>","chicago":"Hoppe, C, F Mitschker, M Butterling, M O Liedke, Maria Teresa de los Arcos de Pedro, P Awakowicz, A Wagner, and Guido Grundmeier. “Characterisation of Micropores in Plasma Deposited SiO x  Films by Means of Positron Annihilation Lifetime Spectroscopy.” <i>Journal of Physics D: Applied Physics</i>, 2020. <a href=\"https://doi.org/10.1088/1361-6463/aba8ba\">https://doi.org/10.1088/1361-6463/aba8ba</a>.","ieee":"C. Hoppe <i>et al.</i>, “Characterisation of micropores in plasma deposited SiO x  films by means of positron annihilation lifetime spectroscopy,” <i>Journal of Physics D: Applied Physics</i>, Art. no. 475205, 2020, doi: <a href=\"https://doi.org/10.1088/1361-6463/aba8ba\">10.1088/1361-6463/aba8ba</a>.","mla":"Hoppe, C., et al. “Characterisation of Micropores in Plasma Deposited SiO x  Films by Means of Positron Annihilation Lifetime Spectroscopy.” <i>Journal of Physics D: Applied Physics</i>, 475205, 2020, doi:<a href=\"https://doi.org/10.1088/1361-6463/aba8ba\">10.1088/1361-6463/aba8ba</a>.","ama":"Hoppe C, Mitschker F, Butterling M, et al. Characterisation of micropores in plasma deposited SiO x  films by means of positron annihilation lifetime spectroscopy. <i>Journal of Physics D: Applied Physics</i>. Published online 2020. doi:<a href=\"https://doi.org/10.1088/1361-6463/aba8ba\">10.1088/1361-6463/aba8ba</a>","short":"C. Hoppe, F. Mitschker, M. Butterling, M.O. Liedke, M.T. de los Arcos de Pedro, P. Awakowicz, A. Wagner, G. Grundmeier, Journal of Physics D: Applied Physics (2020).","bibtex":"@article{Hoppe_Mitschker_Butterling_Liedke_de los Arcos de Pedro_Awakowicz_Wagner_Grundmeier_2020, title={Characterisation of micropores in plasma deposited SiO x  films by means of positron annihilation lifetime spectroscopy}, DOI={<a href=\"https://doi.org/10.1088/1361-6463/aba8ba\">10.1088/1361-6463/aba8ba</a>}, number={475205}, journal={Journal of Physics D: Applied Physics}, author={Hoppe, C and Mitschker, F and Butterling, M and Liedke, M O and de los Arcos de Pedro, Maria Teresa and Awakowicz, P and Wagner, A and Grundmeier, Guido}, year={2020} }"},"article_number":"475205","user_id":"54556"}