{"type":"journal_article","article_number":"475205","citation":{"apa":"Hoppe, C., Mitschker, F., Butterling, M., Liedke, M. O., de los Arcos de Pedro, M. T., Awakowicz, P., Wagner, A., &#38; Grundmeier, G. (2020). Characterisation of micropores in plasma deposited SiO x  films by means of positron annihilation lifetime spectroscopy. <i>Journal of Physics D: Applied Physics</i>, Article 475205. <a href=\"https://doi.org/10.1088/1361-6463/aba8ba\">https://doi.org/10.1088/1361-6463/aba8ba</a>","mla":"Hoppe, C., et al. “Characterisation of Micropores in Plasma Deposited SiO x  Films by Means of Positron Annihilation Lifetime Spectroscopy.” <i>Journal of Physics D: Applied Physics</i>, 475205, 2020, doi:<a href=\"https://doi.org/10.1088/1361-6463/aba8ba\">10.1088/1361-6463/aba8ba</a>.","chicago":"Hoppe, C, F Mitschker, M Butterling, M O Liedke, Maria Teresa de los Arcos de Pedro, P Awakowicz, A Wagner, and Guido Grundmeier. “Characterisation of Micropores in Plasma Deposited SiO x  Films by Means of Positron Annihilation Lifetime Spectroscopy.” <i>Journal of Physics D: Applied Physics</i>, 2020. <a href=\"https://doi.org/10.1088/1361-6463/aba8ba\">https://doi.org/10.1088/1361-6463/aba8ba</a>.","bibtex":"@article{Hoppe_Mitschker_Butterling_Liedke_de los Arcos de Pedro_Awakowicz_Wagner_Grundmeier_2020, title={Characterisation of micropores in plasma deposited SiO x  films by means of positron annihilation lifetime spectroscopy}, DOI={<a href=\"https://doi.org/10.1088/1361-6463/aba8ba\">10.1088/1361-6463/aba8ba</a>}, number={475205}, journal={Journal of Physics D: Applied Physics}, author={Hoppe, C and Mitschker, F and Butterling, M and Liedke, M O and de los Arcos de Pedro, Maria Teresa and Awakowicz, P and Wagner, A and Grundmeier, Guido}, year={2020} }","ieee":"C. Hoppe <i>et al.</i>, “Characterisation of micropores in plasma deposited SiO x  films by means of positron annihilation lifetime spectroscopy,” <i>Journal of Physics D: Applied Physics</i>, Art. no. 475205, 2020, doi: <a href=\"https://doi.org/10.1088/1361-6463/aba8ba\">10.1088/1361-6463/aba8ba</a>.","ama":"Hoppe C, Mitschker F, Butterling M, et al. Characterisation of micropores in plasma deposited SiO x  films by means of positron annihilation lifetime spectroscopy. <i>Journal of Physics D: Applied Physics</i>. Published online 2020. doi:<a href=\"https://doi.org/10.1088/1361-6463/aba8ba\">10.1088/1361-6463/aba8ba</a>","short":"C. Hoppe, F. Mitschker, M. Butterling, M.O. Liedke, M.T. de los Arcos de Pedro, P. Awakowicz, A. Wagner, G. Grundmeier, Journal of Physics D: Applied Physics (2020)."},"department":[{"_id":"302"}],"doi":"10.1088/1361-6463/aba8ba","date_created":"2021-07-07T08:37:16Z","publication_status":"published","_id":"22537","status":"public","author":[{"full_name":"Hoppe, C","last_name":"Hoppe","first_name":"C"},{"full_name":"Mitschker, F","last_name":"Mitschker","first_name":"F"},{"full_name":"Butterling, M","last_name":"Butterling","first_name":"M"},{"last_name":"Liedke","full_name":"Liedke, M O","first_name":"M O"},{"id":"54556","first_name":"Maria Teresa","full_name":"de los Arcos de Pedro, Maria Teresa","last_name":"de los Arcos de Pedro"},{"first_name":"P","full_name":"Awakowicz, P","last_name":"Awakowicz"},{"first_name":"A","last_name":"Wagner","full_name":"Wagner, A"},{"last_name":"Grundmeier","full_name":"Grundmeier, Guido","first_name":"Guido","id":"194"}],"year":"2020","user_id":"54556","publication_identifier":{"issn":["0022-3727","1361-6463"]},"title":"Characterisation of micropores in plasma deposited SiO x  films by means of positron annihilation lifetime spectroscopy","publication":"Journal of Physics D: Applied Physics","language":[{"iso":"eng"}],"date_updated":"2023-01-24T08:34:17Z"}