article published C Hoppe author F Mitschker author M Butterling author M O Liedke author Maria Teresa de los Arcos de Pedro author 54556 P Awakowicz author A Wagner author Guido Grundmeier author 194 302 department 2020 eng 0022-3727 1361-646310.1088/1361-6463/aba8ba Hoppe, C., Mitschker, F., Butterling, M., Liedke, M. O., de los Arcos de Pedro, M. T., Awakowicz, P., Wagner, A., &#38; Grundmeier, G. (2020). Characterisation of micropores in plasma deposited SiO x  films by means of positron annihilation lifetime spectroscopy. <i>Journal of Physics D: Applied Physics</i>, Article 475205. <a href="https://doi.org/10.1088/1361-6463/aba8ba">https://doi.org/10.1088/1361-6463/aba8ba</a> C. Hoppe <i>et al.</i>, “Characterisation of micropores in plasma deposited SiO x  films by means of positron annihilation lifetime spectroscopy,” <i>Journal of Physics D: Applied Physics</i>, Art. no. 475205, 2020, doi: <a href="https://doi.org/10.1088/1361-6463/aba8ba">10.1088/1361-6463/aba8ba</a>. C. Hoppe, F. Mitschker, M. Butterling, M.O. Liedke, M.T. de los Arcos de Pedro, P. Awakowicz, A. Wagner, G. Grundmeier, Journal of Physics D: Applied Physics (2020). Hoppe, C, F Mitschker, M Butterling, M O Liedke, Maria Teresa de los Arcos de Pedro, P Awakowicz, A Wagner, and Guido Grundmeier. “Characterisation of Micropores in Plasma Deposited SiO x  Films by Means of Positron Annihilation Lifetime Spectroscopy.” <i>Journal of Physics D: Applied Physics</i>, 2020. <a href="https://doi.org/10.1088/1361-6463/aba8ba">https://doi.org/10.1088/1361-6463/aba8ba</a>. Hoppe, C., et al. “Characterisation of Micropores in Plasma Deposited SiO x  Films by Means of Positron Annihilation Lifetime Spectroscopy.” <i>Journal of Physics D: Applied Physics</i>, 475205, 2020, doi:<a href="https://doi.org/10.1088/1361-6463/aba8ba">10.1088/1361-6463/aba8ba</a>. Hoppe C, Mitschker F, Butterling M, et al. Characterisation of micropores in plasma deposited SiO x  films by means of positron annihilation lifetime spectroscopy. <i>Journal of Physics D: Applied Physics</i>. Published online 2020. doi:<a href="https://doi.org/10.1088/1361-6463/aba8ba">10.1088/1361-6463/aba8ba</a> @article{Hoppe_Mitschker_Butterling_Liedke_de los Arcos de Pedro_Awakowicz_Wagner_Grundmeier_2020, title={Characterisation of micropores in plasma deposited SiO x  films by means of positron annihilation lifetime spectroscopy}, DOI={<a href="https://doi.org/10.1088/1361-6463/aba8ba">10.1088/1361-6463/aba8ba</a>}, number={475205}, journal={Journal of Physics D: Applied Physics}, author={Hoppe, C and Mitschker, F and Butterling, M and Liedke, M O and de los Arcos de Pedro, Maria Teresa and Awakowicz, P and Wagner, A and Grundmeier, Guido}, year={2020} } 225372021-07-07T08:37:16Z2023-01-24T08:34:17Z