{"date_created":"2021-07-07T09:13:51Z","status":"public","doi":"10.1002/ppap.201500087","date_updated":"2023-01-24T08:18:39Z","page":"926-940","publication":"Plasma Processes and Polymers","citation":{"ama":"Grundmeier G, von Keudell A, de los Arcos de Pedro MT. Fundamentals and Applications of Reflection FTIR Spectroscopy for the Analysis of Plasma Processes at Materials Interfaces. Plasma Processes and Polymers. Published online 2015:926-940. doi:10.1002/ppap.201500087","short":"G. Grundmeier, A. von Keudell, M.T. de los Arcos de Pedro, Plasma Processes and Polymers (2015) 926–940.","chicago":"Grundmeier, Guido, Achim von Keudell, and Maria Teresa de los Arcos de Pedro. “Fundamentals and Applications of Reflection FTIR Spectroscopy for the Analysis of Plasma Processes at Materials Interfaces.” Plasma Processes and Polymers, 2015, 926–40. https://doi.org/10.1002/ppap.201500087.","ieee":"G. Grundmeier, A. von Keudell, and M. T. de los Arcos de Pedro, “Fundamentals and Applications of Reflection FTIR Spectroscopy for the Analysis of Plasma Processes at Materials Interfaces,” Plasma Processes and Polymers, pp. 926–940, 2015, doi: 10.1002/ppap.201500087.","apa":"Grundmeier, G., von Keudell, A., & de los Arcos de Pedro, M. T. (2015). Fundamentals and Applications of Reflection FTIR Spectroscopy for the Analysis of Plasma Processes at Materials Interfaces. Plasma Processes and Polymers, 926–940. https://doi.org/10.1002/ppap.201500087","bibtex":"@article{Grundmeier_von Keudell_de los Arcos de Pedro_2015, title={Fundamentals and Applications of Reflection FTIR Spectroscopy for the Analysis of Plasma Processes at Materials Interfaces}, DOI={10.1002/ppap.201500087}, journal={Plasma Processes and Polymers}, author={Grundmeier, Guido and von Keudell, Achim and de los Arcos de Pedro, Maria Teresa}, year={2015}, pages={926–940} }","mla":"Grundmeier, Guido, et al. “Fundamentals and Applications of Reflection FTIR Spectroscopy for the Analysis of Plasma Processes at Materials Interfaces.” Plasma Processes and Polymers, 2015, pp. 926–40, doi:10.1002/ppap.201500087."},"_id":"22579","user_id":"54556","language":[{"iso":"eng"}],"type":"journal_article","department":[{"_id":"302"}],"author":[{"full_name":"Grundmeier, Guido","last_name":"Grundmeier","first_name":"Guido"},{"first_name":"Achim","full_name":"von Keudell, Achim","last_name":"von Keudell"},{"last_name":"de los Arcos de Pedro","full_name":"de los Arcos de Pedro, Maria Teresa","id":"54556","first_name":"Maria Teresa"}],"publication_status":"published","year":"2015","title":"Fundamentals and Applications of Reflection FTIR Spectroscopy for the Analysis of Plasma Processes at Materials Interfaces","publication_identifier":{"issn":["1612-8850"]}}