{"citation":{"short":"M. Prenzel, M.T. de los Arcos de Pedro, A. Kortmann, J. Winter, A. von Keudell, Journal of Applied Physics (2012).","chicago":"Prenzel, Marina, Maria Teresa de los Arcos de Pedro, Annika Kortmann, Jörg Winter, and Achim von Keudell. “Embedded Argon as a Tool for Sampling Local Structure in Thin Plasma Deposited Aluminum Oxide Films.” <i>Journal of Applied Physics</i>, 2012. <a href=\"https://doi.org/10.1063/1.4767383\">https://doi.org/10.1063/1.4767383</a>.","bibtex":"@article{Prenzel_de los Arcos de Pedro_Kortmann_Winter_von Keudell_2012, title={Embedded argon as a tool for sampling local structure in thin plasma deposited aluminum oxide films}, DOI={<a href=\"https://doi.org/10.1063/1.4767383\">10.1063/1.4767383</a>}, number={103306}, journal={Journal of Applied Physics}, author={Prenzel, Marina and de los Arcos de Pedro, Maria Teresa and Kortmann, Annika and Winter, Jörg and von Keudell, Achim}, year={2012} }","apa":"Prenzel, M., de los Arcos de Pedro, M. T., Kortmann, A., Winter, J., &#38; von Keudell, A. (2012). Embedded argon as a tool for sampling local structure in thin plasma deposited aluminum oxide films. <i>Journal of Applied Physics</i>, Article 103306. <a href=\"https://doi.org/10.1063/1.4767383\">https://doi.org/10.1063/1.4767383</a>","ieee":"M. Prenzel, M. T. de los Arcos de Pedro, A. Kortmann, J. Winter, and A. von Keudell, “Embedded argon as a tool for sampling local structure in thin plasma deposited aluminum oxide films,” <i>Journal of Applied Physics</i>, Art. no. 103306, 2012, doi: <a href=\"https://doi.org/10.1063/1.4767383\">10.1063/1.4767383</a>.","mla":"Prenzel, Marina, et al. “Embedded Argon as a Tool for Sampling Local Structure in Thin Plasma Deposited Aluminum Oxide Films.” <i>Journal of Applied Physics</i>, 103306, 2012, doi:<a href=\"https://doi.org/10.1063/1.4767383\">10.1063/1.4767383</a>.","ama":"Prenzel M, de los Arcos de Pedro MT, Kortmann A, Winter J, von Keudell A. Embedded argon as a tool for sampling local structure in thin plasma deposited aluminum oxide films. <i>Journal of Applied Physics</i>. Published online 2012. doi:<a href=\"https://doi.org/10.1063/1.4767383\">10.1063/1.4767383</a>"},"user_id":"54556","date_created":"2021-07-07T11:30:38Z","department":[{"_id":"302"}],"publication_identifier":{"issn":["0021-8979","1089-7550"]},"_id":"22603","title":"Embedded argon as a tool for sampling local structure in thin plasma deposited aluminum oxide films","extern":"1","author":[{"last_name":"Prenzel","full_name":"Prenzel, Marina","first_name":"Marina"},{"last_name":"de los Arcos de Pedro","id":"54556","full_name":"de los Arcos de Pedro, Maria Teresa","first_name":"Maria Teresa"},{"first_name":"Annika","last_name":"Kortmann","full_name":"Kortmann, Annika"},{"first_name":"Jörg","last_name":"Winter","full_name":"Winter, Jörg"},{"first_name":"Achim","last_name":"von Keudell","full_name":"von Keudell, Achim"}],"status":"public","year":"2012","publication":"Journal of Applied Physics","type":"journal_article","date_updated":"2023-01-24T08:25:58Z","doi":"10.1063/1.4767383","article_number":"103306","publication_status":"published","language":[{"iso":"eng"}]}