[{"language":[{"iso":"eng"}],"year":"2011","citation":{"ieee":"A. R. Lahrood, M. T. de los Arcos de Pedro, M. Prenzel, A. von Keudell, and J. Winter, “X-ray photoelectron spectroscopy on implanted argon as a tool to follow local structural changes in thin films,” Thin Solid Films, pp. 1625–1630, 2011, doi: 10.1016/j.tsf.2011.07.040.","short":"A.R. Lahrood, M.T. de los Arcos de Pedro, M. Prenzel, A. von Keudell, J. Winter, Thin Solid Films (2011) 1625–1630.","mla":"Lahrood, Atena Rastgoo, et al. “X-Ray Photoelectron Spectroscopy on Implanted Argon as a Tool to Follow Local Structural Changes in Thin Films.” Thin Solid Films, 2011, pp. 1625–30, doi:10.1016/j.tsf.2011.07.040.","bibtex":"@article{Lahrood_de los Arcos de Pedro_Prenzel_von Keudell_Winter_2011, title={X-ray photoelectron spectroscopy on implanted argon as a tool to follow local structural changes in thin films}, DOI={10.1016/j.tsf.2011.07.040}, journal={Thin Solid Films}, author={Lahrood, Atena Rastgoo and de los Arcos de Pedro, Maria Teresa and Prenzel, Marina and von Keudell, Achim and Winter, Jörg}, year={2011}, pages={1625–1630} }","apa":"Lahrood, A. R., de los Arcos de Pedro, M. T., Prenzel, M., von Keudell, A., & Winter, J. (2011). X-ray photoelectron spectroscopy on implanted argon as a tool to follow local structural changes in thin films. Thin Solid Films, 1625–1630. https://doi.org/10.1016/j.tsf.2011.07.040","ama":"Lahrood AR, de los Arcos de Pedro MT, Prenzel M, von Keudell A, Winter J. X-ray photoelectron spectroscopy on implanted argon as a tool to follow local structural changes in thin films. Thin Solid Films. Published online 2011:1625-1630. doi:10.1016/j.tsf.2011.07.040","chicago":"Lahrood, Atena Rastgoo, Maria Teresa de los Arcos de Pedro, Marina Prenzel, Achim von Keudell, and Jörg Winter. “X-Ray Photoelectron Spectroscopy on Implanted Argon as a Tool to Follow Local Structural Changes in Thin Films.” Thin Solid Films, 2011, 1625–30. https://doi.org/10.1016/j.tsf.2011.07.040."},"type":"journal_article","page":"1625-1630","_id":"22606","date_updated":"2023-01-24T08:27:01Z","doi":"10.1016/j.tsf.2011.07.040","author":[{"full_name":"Lahrood, Atena Rastgoo","first_name":"Atena Rastgoo","last_name":"Lahrood"},{"first_name":"Maria Teresa","full_name":"de los Arcos de Pedro, Maria Teresa","last_name":"de los Arcos de Pedro","id":"54556"},{"last_name":"Prenzel","first_name":"Marina","full_name":"Prenzel, Marina"},{"first_name":"Achim","full_name":"von Keudell, Achim","last_name":"von Keudell"},{"last_name":"Winter","full_name":"Winter, Jörg","first_name":"Jörg"}],"department":[{"_id":"302"}],"publication":"Thin Solid Films","status":"public","date_created":"2021-07-07T11:31:20Z","publication_identifier":{"issn":["0040-6090"]},"publication_status":"published","extern":"1","user_id":"54556","title":"X-ray photoelectron spectroscopy on implanted argon as a tool to follow local structural changes in thin films"}]