{"title":"X-ray photoelectron spectroscopy on implanted argon as a tool to follow local structural changes in thin films","date_created":"2021-07-07T11:31:20Z","publication":"Thin Solid Films","page":"1625-1630","type":"journal_article","year":"2011","publication_identifier":{"issn":["0040-6090"]},"extern":"1","language":[{"iso":"eng"}],"_id":"22606","date_updated":"2023-01-24T08:27:01Z","status":"public","author":[{"full_name":"Lahrood, Atena Rastgoo","last_name":"Lahrood","first_name":"Atena Rastgoo"},{"id":"54556","first_name":"Maria Teresa","full_name":"de los Arcos de Pedro, Maria Teresa","last_name":"de los Arcos de Pedro"},{"full_name":"Prenzel, Marina","last_name":"Prenzel","first_name":"Marina"},{"full_name":"von Keudell, Achim","last_name":"von Keudell","first_name":"Achim"},{"last_name":"Winter","full_name":"Winter, Jörg","first_name":"Jörg"}],"publication_status":"published","doi":"10.1016/j.tsf.2011.07.040","user_id":"54556","citation":{"mla":"Lahrood, Atena Rastgoo, et al. “X-Ray Photoelectron Spectroscopy on Implanted Argon as a Tool to Follow Local Structural Changes in Thin Films.” <i>Thin Solid Films</i>, 2011, pp. 1625–30, doi:<a href=\"https://doi.org/10.1016/j.tsf.2011.07.040\">10.1016/j.tsf.2011.07.040</a>.","short":"A.R. Lahrood, M.T. de los Arcos de Pedro, M. Prenzel, A. von Keudell, J. Winter, Thin Solid Films (2011) 1625–1630.","apa":"Lahrood, A. R., de los Arcos de Pedro, M. T., Prenzel, M., von Keudell, A., &#38; Winter, J. (2011). X-ray photoelectron spectroscopy on implanted argon as a tool to follow local structural changes in thin films. <i>Thin Solid Films</i>, 1625–1630. <a href=\"https://doi.org/10.1016/j.tsf.2011.07.040\">https://doi.org/10.1016/j.tsf.2011.07.040</a>","ama":"Lahrood AR, de los Arcos de Pedro MT, Prenzel M, von Keudell A, Winter J. X-ray photoelectron spectroscopy on implanted argon as a tool to follow local structural changes in thin films. <i>Thin Solid Films</i>. Published online 2011:1625-1630. doi:<a href=\"https://doi.org/10.1016/j.tsf.2011.07.040\">10.1016/j.tsf.2011.07.040</a>","bibtex":"@article{Lahrood_de los Arcos de Pedro_Prenzel_von Keudell_Winter_2011, title={X-ray photoelectron spectroscopy on implanted argon as a tool to follow local structural changes in thin films}, DOI={<a href=\"https://doi.org/10.1016/j.tsf.2011.07.040\">10.1016/j.tsf.2011.07.040</a>}, journal={Thin Solid Films}, author={Lahrood, Atena Rastgoo and de los Arcos de Pedro, Maria Teresa and Prenzel, Marina and von Keudell, Achim and Winter, Jörg}, year={2011}, pages={1625–1630} }","ieee":"A. R. Lahrood, M. T. de los Arcos de Pedro, M. Prenzel, A. von Keudell, and J. Winter, “X-ray photoelectron spectroscopy on implanted argon as a tool to follow local structural changes in thin films,” <i>Thin Solid Films</i>, pp. 1625–1630, 2011, doi: <a href=\"https://doi.org/10.1016/j.tsf.2011.07.040\">10.1016/j.tsf.2011.07.040</a>.","chicago":"Lahrood, Atena Rastgoo, Maria Teresa de los Arcos de Pedro, Marina Prenzel, Achim von Keudell, and Jörg Winter. “X-Ray Photoelectron Spectroscopy on Implanted Argon as a Tool to Follow Local Structural Changes in Thin Films.” <i>Thin Solid Films</i>, 2011, 1625–30. <a href=\"https://doi.org/10.1016/j.tsf.2011.07.040\">https://doi.org/10.1016/j.tsf.2011.07.040</a>."},"department":[{"_id":"302"}]}