{"author":[{"last_name":"Bozsoki","first_name":"P.","full_name":"Bozsoki, P."},{"full_name":"Thomas, P.","first_name":"P.","last_name":"Thomas"},{"full_name":"Kira, M.","first_name":"M.","last_name":"Kira"},{"full_name":"Hoyer, W.","first_name":"W.","last_name":"Hoyer"},{"full_name":"Meier, Torsten","id":"344","first_name":"Torsten","orcid":"0000-0001-8864-2072","last_name":"Meier"},{"last_name":"Koch","first_name":"S. W.","full_name":"Koch, S. W."},{"first_name":"K.","full_name":"Maschke, K.","last_name":"Maschke"},{"last_name":"Varga","first_name":"I.","full_name":"Varga, I."},{"last_name":"Stolz","first_name":"H.","full_name":"Stolz, H."}],"_id":"23495","date_created":"2021-08-24T09:17:28Z","publication":"Physical Review Letters","department":[{"_id":"15"},{"_id":"170"},{"_id":"293"},{"_id":"230"}],"doi":"10.1103/physrevlett.97.227402","date_updated":"2023-01-27T12:58:34Z","type":"journal_article","publication_identifier":{"issn":["0031-9007","1079-7114"]},"language":[{"iso":"eng"}],"publication_status":"published","title":"Characterization of Disorder in Semiconductors via Single-Photon Interferometry","year":"2006","citation":{"mla":"Bozsoki, P., et al. “Characterization of Disorder in Semiconductors via Single-Photon Interferometry.” <i>Physical Review Letters</i>, 2006, doi:<a href=\"https://doi.org/10.1103/physrevlett.97.227402\">10.1103/physrevlett.97.227402</a>.","ieee":"P. Bozsoki <i>et al.</i>, “Characterization of Disorder in Semiconductors via Single-Photon Interferometry,” <i>Physical Review Letters</i>, 2006, doi: <a href=\"https://doi.org/10.1103/physrevlett.97.227402\">10.1103/physrevlett.97.227402</a>.","short":"P. Bozsoki, P. Thomas, M. Kira, W. Hoyer, T. Meier, S.W. Koch, K. Maschke, I. Varga, H. Stolz, Physical Review Letters (2006).","apa":"Bozsoki, P., Thomas, P., Kira, M., Hoyer, W., Meier, T., Koch, S. W., Maschke, K., Varga, I., &#38; Stolz, H. (2006). Characterization of Disorder in Semiconductors via Single-Photon Interferometry. <i>Physical Review Letters</i>. <a href=\"https://doi.org/10.1103/physrevlett.97.227402\">https://doi.org/10.1103/physrevlett.97.227402</a>","bibtex":"@article{Bozsoki_Thomas_Kira_Hoyer_Meier_Koch_Maschke_Varga_Stolz_2006, title={Characterization of Disorder in Semiconductors via Single-Photon Interferometry}, DOI={<a href=\"https://doi.org/10.1103/physrevlett.97.227402\">10.1103/physrevlett.97.227402</a>}, journal={Physical Review Letters}, author={Bozsoki, P. and Thomas, P. and Kira, M. and Hoyer, W. and Meier, Torsten and Koch, S. W. and Maschke, K. and Varga, I. and Stolz, H.}, year={2006} }","ama":"Bozsoki P, Thomas P, Kira M, et al. Characterization of Disorder in Semiconductors via Single-Photon Interferometry. <i>Physical Review Letters</i>. Published online 2006. doi:<a href=\"https://doi.org/10.1103/physrevlett.97.227402\">10.1103/physrevlett.97.227402</a>","chicago":"Bozsoki, P., P. Thomas, M. Kira, W. Hoyer, Torsten Meier, S. W. Koch, K. Maschke, I. Varga, and H. Stolz. “Characterization of Disorder in Semiconductors via Single-Photon Interferometry.” <i>Physical Review Letters</i>, 2006. <a href=\"https://doi.org/10.1103/physrevlett.97.227402\">https://doi.org/10.1103/physrevlett.97.227402</a>."},"status":"public","user_id":"16199"}