{"article_number":"227402","doi":"10.1103/physrevlett.97.227402","issue":"22","publication_status":"published","date_created":"2021-08-24T09:17:28Z","abstract":[{"lang":"eng","text":"The method of angular photonic correlations of spontaneous emission is introduced as an experimental, purely optical scheme to characterize disorder in semiconductor nanostructures. The theoretical expression for the angular correlations is derived and numerically evaluated for a model system. The results demonstrate how the proposed experimental method yields direct information about the spatial distribution of the relevant states and thus on the disorder present in the system."}],"publication":"Physical Review Letters","date_updated":"2023-04-24T05:39:51Z","type":"journal_article","language":[{"iso":"eng"}],"citation":{"ama":"Bozsoki P, Thomas P, Kira M, et al. Characterization of Disorder in Semiconductors via Single-Photon Interferometry. <i>Physical Review Letters</i>. 2006;97(22). doi:<a href=\"https://doi.org/10.1103/physrevlett.97.227402\">10.1103/physrevlett.97.227402</a>","mla":"Bozsoki, P., et al. “Characterization of Disorder in Semiconductors via Single-Photon Interferometry.” <i>Physical Review Letters</i>, vol. 97, no. 22, 227402, 2006, doi:<a href=\"https://doi.org/10.1103/physrevlett.97.227402\">10.1103/physrevlett.97.227402</a>.","ieee":"P. Bozsoki <i>et al.</i>, “Characterization of Disorder in Semiconductors via Single-Photon Interferometry,” <i>Physical Review Letters</i>, vol. 97, no. 22, Art. no. 227402, 2006, doi: <a href=\"https://doi.org/10.1103/physrevlett.97.227402\">10.1103/physrevlett.97.227402</a>.","apa":"Bozsoki, P., Thomas, P., Kira, M., Hoyer, W., Meier, T., Koch, S. W., Maschke, K., Varga, I., &#38; Stolz, H. (2006). Characterization of Disorder in Semiconductors via Single-Photon Interferometry. <i>Physical Review Letters</i>, <i>97</i>(22), Article 227402. <a href=\"https://doi.org/10.1103/physrevlett.97.227402\">https://doi.org/10.1103/physrevlett.97.227402</a>","bibtex":"@article{Bozsoki_Thomas_Kira_Hoyer_Meier_Koch_Maschke_Varga_Stolz_2006, title={Characterization of Disorder in Semiconductors via Single-Photon Interferometry}, volume={97}, DOI={<a href=\"https://doi.org/10.1103/physrevlett.97.227402\">10.1103/physrevlett.97.227402</a>}, number={22227402}, journal={Physical Review Letters}, author={Bozsoki, P. and Thomas, P. and Kira, M. and Hoyer, W. and Meier, Torsten and Koch, S. W. and Maschke, K. and Varga, I. and Stolz, H.}, year={2006} }","short":"P. Bozsoki, P. Thomas, M. Kira, W. Hoyer, T. Meier, S.W. Koch, K. Maschke, I. Varga, H. Stolz, Physical Review Letters 97 (2006).","chicago":"Bozsoki, P., P. Thomas, M. Kira, W. Hoyer, Torsten Meier, S. W. Koch, K. Maschke, I. Varga, and H. Stolz. “Characterization of Disorder in Semiconductors via Single-Photon Interferometry.” <i>Physical Review Letters</i> 97, no. 22 (2006). <a href=\"https://doi.org/10.1103/physrevlett.97.227402\">https://doi.org/10.1103/physrevlett.97.227402</a>."},"user_id":"49063","volume":97,"department":[{"_id":"15"},{"_id":"170"},{"_id":"293"},{"_id":"230"}],"publication_identifier":{"issn":["0031-9007","1079-7114"]},"title":"Characterization of Disorder in Semiconductors via Single-Photon Interferometry","_id":"23495","author":[{"full_name":"Bozsoki, P.","last_name":"Bozsoki","first_name":"P."},{"last_name":"Thomas","full_name":"Thomas, P.","first_name":"P."},{"full_name":"Kira, M.","last_name":"Kira","first_name":"M."},{"first_name":"W.","last_name":"Hoyer","full_name":"Hoyer, W."},{"full_name":"Meier, Torsten","last_name":"Meier","id":"344","first_name":"Torsten","orcid":"0000-0001-8864-2072"},{"first_name":"S. W.","last_name":"Koch","full_name":"Koch, S. W."},{"last_name":"Maschke","full_name":"Maschke, K.","first_name":"K."},{"first_name":"I.","full_name":"Varga, I.","last_name":"Varga"},{"last_name":"Stolz","full_name":"Stolz, H.","first_name":"H."}],"extern":"1","year":"2006","intvolume":"        97","status":"public"}