{"date_created":"2021-09-01T09:48:56Z","year":"2014","publication_status":"published","citation":{"short":"A. Khassanov, T. Schmaltz, H.-G. Steinrück, A. Magerl, A. Hirsch, M. Halik, Advanced Materials Interfaces 1 (2014) 1400238.","mla":"Khassanov, Artoem, et al. “Interface Engineering of Molecular Charge Storage Dielectric Layers for Organic Thin-Film Memory Transistors.” Advanced Materials Interfaces, vol. 1, 2014, p. 1400238, doi:10.1002/admi.201400238.","chicago":"Khassanov, Artoem, Thomas Schmaltz, Hans-Georg Steinrück, Andreas Magerl, Andreas Hirsch, and Marcus Halik. “Interface Engineering of Molecular Charge Storage Dielectric Layers for Organic Thin-Film Memory Transistors.” Advanced Materials Interfaces 1 (2014): 1400238. https://doi.org/10.1002/admi.201400238.","ama":"Khassanov A, Schmaltz T, Steinrück H-G, Magerl A, Hirsch A, Halik M. Interface Engineering of Molecular Charge Storage Dielectric Layers for Organic Thin-Film Memory Transistors. Advanced Materials Interfaces. 2014;1:1400238. doi:10.1002/admi.201400238","apa":"Khassanov, A., Schmaltz, T., Steinrück, H.-G., Magerl, A., Hirsch, A., & Halik, M. (2014). Interface Engineering of Molecular Charge Storage Dielectric Layers for Organic Thin-Film Memory Transistors. Advanced Materials Interfaces, 1, 1400238. https://doi.org/10.1002/admi.201400238","ieee":"A. Khassanov, T. Schmaltz, H.-G. Steinrück, A. Magerl, A. Hirsch, and M. Halik, “Interface Engineering of Molecular Charge Storage Dielectric Layers for Organic Thin-Film Memory Transistors,” Advanced Materials Interfaces, vol. 1, p. 1400238, 2014, doi: 10.1002/admi.201400238.","bibtex":"@article{Khassanov_Schmaltz_Steinrück_Magerl_Hirsch_Halik_2014, title={Interface Engineering of Molecular Charge Storage Dielectric Layers for Organic Thin-Film Memory Transistors}, volume={1}, DOI={10.1002/admi.201400238}, journal={Advanced Materials Interfaces}, author={Khassanov, Artoem and Schmaltz, Thomas and Steinrück, Hans-Georg and Magerl, Andreas and Hirsch, Andreas and Halik, Marcus}, year={2014}, pages={1400238} }"},"volume":1,"doi":"10.1002/admi.201400238","user_id":"84268","publication_identifier":{"issn":["2196-7350"]},"author":[{"first_name":"Artoem","last_name":"Khassanov","full_name":"Khassanov, Artoem"},{"last_name":"Schmaltz","first_name":"Thomas","full_name":"Schmaltz, Thomas"},{"id":"84268","full_name":"Steinrück, Hans-Georg","first_name":"Hans-Georg","last_name":"Steinrück","orcid":"0000-0001-6373-0877"},{"full_name":"Magerl, Andreas","last_name":"Magerl","first_name":"Andreas"},{"full_name":"Hirsch, Andreas","last_name":"Hirsch","first_name":"Andreas"},{"last_name":"Halik","first_name":"Marcus","full_name":"Halik, Marcus"}],"department":[{"_id":"633"}],"_id":"23638","title":"Interface Engineering of Molecular Charge Storage Dielectric Layers for Organic Thin-Film Memory Transistors","page":"1400238","intvolume":" 1","publication":"Advanced Materials Interfaces","date_updated":"2022-01-06T06:55:57Z","status":"public","type":"journal_article","language":[{"iso":"eng"}]}