article published Artoem Khassanov author Thomas Schmaltz author Hans-Georg Steinrück author 842680000-0001-6373-0877 Andreas Magerl author Andreas Hirsch author Marcus Halik author 633 department 2014 eng 2196-735010.1002/admi.201400238 11400238 Khassanov, Artoem, Thomas Schmaltz, Hans-Georg Steinrück, Andreas Magerl, Andreas Hirsch, and Marcus Halik. “Interface Engineering of Molecular Charge Storage Dielectric Layers for Organic Thin-Film Memory Transistors.” <i>Advanced Materials Interfaces</i> 1 (2014): 1400238. <a href="https://doi.org/10.1002/admi.201400238">https://doi.org/10.1002/admi.201400238</a>. A. Khassanov, T. Schmaltz, H.-G. Steinrück, A. Magerl, A. Hirsch, and M. Halik, “Interface Engineering of Molecular Charge Storage Dielectric Layers for Organic Thin-Film Memory Transistors,” <i>Advanced Materials Interfaces</i>, vol. 1, p. 1400238, 2014, doi: <a href="https://doi.org/10.1002/admi.201400238">10.1002/admi.201400238</a>. Khassanov A, Schmaltz T, Steinrück H-G, Magerl A, Hirsch A, Halik M. Interface Engineering of Molecular Charge Storage Dielectric Layers for Organic Thin-Film Memory Transistors. <i>Advanced Materials Interfaces</i>. 2014;1:1400238. doi:<a href="https://doi.org/10.1002/admi.201400238">10.1002/admi.201400238</a> Khassanov, Artoem, et al. “Interface Engineering of Molecular Charge Storage Dielectric Layers for Organic Thin-Film Memory Transistors.” <i>Advanced Materials Interfaces</i>, vol. 1, 2014, p. 1400238, doi:<a href="https://doi.org/10.1002/admi.201400238">10.1002/admi.201400238</a>. A. Khassanov, T. Schmaltz, H.-G. Steinrück, A. Magerl, A. Hirsch, M. Halik, Advanced Materials Interfaces 1 (2014) 1400238. @article{Khassanov_Schmaltz_Steinrück_Magerl_Hirsch_Halik_2014, title={Interface Engineering of Molecular Charge Storage Dielectric Layers for Organic Thin-Film Memory Transistors}, volume={1}, DOI={<a href="https://doi.org/10.1002/admi.201400238">10.1002/admi.201400238</a>}, journal={Advanced Materials Interfaces}, author={Khassanov, Artoem and Schmaltz, Thomas and Steinrück, Hans-Georg and Magerl, Andreas and Hirsch, Andreas and Halik, Marcus}, year={2014}, pages={1400238} } Khassanov, A., Schmaltz, T., Steinrück, H.-G., Magerl, A., Hirsch, A., &#38; Halik, M. (2014). Interface Engineering of Molecular Charge Storage Dielectric Layers for Organic Thin-Film Memory Transistors. <i>Advanced Materials Interfaces</i>, <i>1</i>, 1400238. <a href="https://doi.org/10.1002/admi.201400238">https://doi.org/10.1002/admi.201400238</a> 236382021-09-01T09:48:56Z2022-01-06T06:55:57Z