{"year":"2007","quality_controlled":"1","_id":"2393","publication":"Proc. Int. Conf. Networked Sensing Systems (INSS)","doi":"10.1109/INSS.2007.4297445","date_updated":"2023-09-26T14:00:58Z","type":"conference","place":"Piscataway, NJ, USA","title":"Automated Wireless Sensor Network Testing","author":[{"last_name":"Beutel","first_name":"Jan","full_name":"Beutel, Jan"},{"full_name":"Dyer, Matthias","last_name":"Dyer","first_name":"Matthias"},{"full_name":"Lim, Roman","first_name":"Roman","last_name":"Lim"},{"last_name":"Plessl","first_name":"Christian","id":"16153","orcid":"0000-0001-5728-9982","full_name":"Plessl, Christian"},{"full_name":"Woehrle, Matthias","first_name":"Matthias","last_name":"Woehrle"},{"full_name":"Yuecel, Mustafa","first_name":"Mustafa","last_name":"Yuecel"},{"first_name":"Lothar","last_name":"Thiele","full_name":"Thiele, Lothar"}],"department":[{"_id":"27"},{"_id":"518"}],"date_created":"2018-04-17T13:35:55Z","page":"303-303","status":"public","citation":{"apa":"Beutel, J., Dyer, M., Lim, R., Plessl, C., Woehrle, M., Yuecel, M., & Thiele, L. (2007). Automated Wireless Sensor Network Testing. Proc. Int. Conf. Networked Sensing Systems (INSS), 303–303. https://doi.org/10.1109/INSS.2007.4297445","chicago":"Beutel, Jan, Matthias Dyer, Roman Lim, Christian Plessl, Matthias Woehrle, Mustafa Yuecel, and Lothar Thiele. “Automated Wireless Sensor Network Testing.” In Proc. Int. Conf. Networked Sensing Systems (INSS), 303–303. Piscataway, NJ, USA: IEEE, 2007. https://doi.org/10.1109/INSS.2007.4297445.","short":"J. Beutel, M. Dyer, R. Lim, C. Plessl, M. Woehrle, M. Yuecel, L. Thiele, in: Proc. Int. Conf. Networked Sensing Systems (INSS), IEEE, Piscataway, NJ, USA, 2007, pp. 303–303.","bibtex":"@inproceedings{Beutel_Dyer_Lim_Plessl_Woehrle_Yuecel_Thiele_2007, place={Piscataway, NJ, USA}, title={Automated Wireless Sensor Network Testing}, DOI={10.1109/INSS.2007.4297445}, booktitle={Proc. Int. Conf. Networked Sensing Systems (INSS)}, publisher={IEEE}, author={Beutel, Jan and Dyer, Matthias and Lim, Roman and Plessl, Christian and Woehrle, Matthias and Yuecel, Mustafa and Thiele, Lothar}, year={2007}, pages={303–303} }","ama":"Beutel J, Dyer M, Lim R, et al. Automated Wireless Sensor Network Testing. In: Proc. Int. Conf. Networked Sensing Systems (INSS). IEEE; 2007:303-303. doi:10.1109/INSS.2007.4297445","ieee":"J. Beutel et al., “Automated Wireless Sensor Network Testing,” in Proc. Int. Conf. Networked Sensing Systems (INSS), 2007, pp. 303–303, doi: 10.1109/INSS.2007.4297445.","mla":"Beutel, Jan, et al. “Automated Wireless Sensor Network Testing.” Proc. Int. Conf. Networked Sensing Systems (INSS), IEEE, 2007, pp. 303–303, doi:10.1109/INSS.2007.4297445."},"keyword":["WSN","testing","verification"],"user_id":"15278","publisher":"IEEE","publication_identifier":{"isbn":["1-4244-1231-5"]},"language":[{"iso":"eng"}]}