[{"publication_identifier":{"isbn":["1-4244-1231-5"]},"department":[{"_id":"27"},{"_id":"518"}],"date_created":"2018-04-17T13:35:55Z","place":"Piscataway, NJ, USA","author":[{"last_name":"Beutel","full_name":"Beutel, Jan","first_name":"Jan"},{"last_name":"Dyer","first_name":"Matthias","full_name":"Dyer, Matthias"},{"full_name":"Lim, Roman","first_name":"Roman","last_name":"Lim"},{"last_name":"Plessl","orcid":"0000-0001-5728-9982","first_name":"Christian","full_name":"Plessl, Christian","id":"16153"},{"full_name":"Woehrle, Matthias","first_name":"Matthias","last_name":"Woehrle"},{"last_name":"Yuecel","full_name":"Yuecel, Mustafa","first_name":"Mustafa"},{"first_name":"Lothar","full_name":"Thiele, Lothar","last_name":"Thiele"}],"title":"Automated Wireless Sensor Network Testing","publication":"Proc. Int. Conf. Networked Sensing Systems (INSS)","doi":"10.1109/INSS.2007.4297445","date_updated":"2019-01-03T13:13:08Z","_id":"2393","citation":{"apa":"Beutel, J., Dyer, M., Lim, R., Plessl, C., Woehrle, M., Yuecel, M., &#38; Thiele, L. (2007). Automated Wireless Sensor Network Testing. In <i>Proc. Int. Conf. Networked Sensing Systems (INSS)</i> (pp. 303–303). Piscataway, NJ, USA: IEEE. <a href=\"https://doi.org/10.1109/INSS.2007.4297445\">https://doi.org/10.1109/INSS.2007.4297445</a>","mla":"Beutel, Jan, et al. “Automated Wireless Sensor Network Testing.” <i>Proc. Int. Conf. Networked Sensing Systems (INSS)</i>, IEEE, 2007, pp. 303–303, doi:<a href=\"https://doi.org/10.1109/INSS.2007.4297445\">10.1109/INSS.2007.4297445</a>.","short":"J. Beutel, M. Dyer, R. Lim, C. Plessl, M. Woehrle, M. Yuecel, L. Thiele, in: Proc. Int. Conf. Networked Sensing Systems (INSS), IEEE, Piscataway, NJ, USA, 2007, pp. 303–303.","ieee":"J. Beutel <i>et al.</i>, “Automated Wireless Sensor Network Testing,” in <i>Proc. Int. Conf. Networked Sensing Systems (INSS)</i>, 2007, pp. 303–303.","chicago":"Beutel, Jan, Matthias Dyer, Roman Lim, Christian Plessl, Matthias Woehrle, Mustafa Yuecel, and Lothar Thiele. “Automated Wireless Sensor Network Testing.” In <i>Proc. Int. Conf. Networked Sensing Systems (INSS)</i>, 303–303. Piscataway, NJ, USA: IEEE, 2007. <a href=\"https://doi.org/10.1109/INSS.2007.4297445\">https://doi.org/10.1109/INSS.2007.4297445</a>.","ama":"Beutel J, Dyer M, Lim R, et al. Automated Wireless Sensor Network Testing. In: <i>Proc. Int. Conf. Networked Sensing Systems (INSS)</i>. Piscataway, NJ, USA: IEEE; 2007:303-303. doi:<a href=\"https://doi.org/10.1109/INSS.2007.4297445\">10.1109/INSS.2007.4297445</a>","bibtex":"@inproceedings{Beutel_Dyer_Lim_Plessl_Woehrle_Yuecel_Thiele_2007, place={Piscataway, NJ, USA}, title={Automated Wireless Sensor Network Testing}, DOI={<a href=\"https://doi.org/10.1109/INSS.2007.4297445\">10.1109/INSS.2007.4297445</a>}, booktitle={Proc. Int. Conf. Networked Sensing Systems (INSS)}, publisher={IEEE}, author={Beutel, Jan and Dyer, Matthias and Lim, Roman and Plessl, Christian and Woehrle, Matthias and Yuecel, Mustafa and Thiele, Lothar}, year={2007}, pages={303–303} }"},"page":"303-303","publisher":"IEEE","user_id":"24135","year":"2007","type":"conference","status":"public","keyword":["WSN","testing","verification"]}]