{"doi":"10.1109/INSS.2007.4297445","keyword":["WSN","testing","verification"],"department":[{"_id":"27"},{"_id":"518"}],"quality_controlled":"1","title":"Automated Wireless Sensor Network Testing","date_updated":"2023-09-26T14:00:58Z","user_id":"15278","type":"conference","page":"303-303","status":"public","author":[{"full_name":"Beutel, Jan","first_name":"Jan","last_name":"Beutel"},{"last_name":"Dyer","first_name":"Matthias","full_name":"Dyer, Matthias"},{"full_name":"Lim, Roman","last_name":"Lim","first_name":"Roman"},{"first_name":"Christian","last_name":"Plessl","id":"16153","orcid":"0000-0001-5728-9982","full_name":"Plessl, Christian"},{"full_name":"Woehrle, Matthias","last_name":"Woehrle","first_name":"Matthias"},{"last_name":"Yuecel","first_name":"Mustafa","full_name":"Yuecel, Mustafa"},{"full_name":"Thiele, Lothar","first_name":"Lothar","last_name":"Thiele"}],"date_created":"2018-04-17T13:35:55Z","publisher":"IEEE","publication":"Proc. Int. Conf. Networked Sensing Systems (INSS)","_id":"2393","place":"Piscataway, NJ, USA","year":"2007","citation":{"bibtex":"@inproceedings{Beutel_Dyer_Lim_Plessl_Woehrle_Yuecel_Thiele_2007, place={Piscataway, NJ, USA}, title={Automated Wireless Sensor Network Testing}, DOI={<a href=\"https://doi.org/10.1109/INSS.2007.4297445\">10.1109/INSS.2007.4297445</a>}, booktitle={Proc. Int. Conf. Networked Sensing Systems (INSS)}, publisher={IEEE}, author={Beutel, Jan and Dyer, Matthias and Lim, Roman and Plessl, Christian and Woehrle, Matthias and Yuecel, Mustafa and Thiele, Lothar}, year={2007}, pages={303–303} }","ieee":"J. Beutel <i>et al.</i>, “Automated Wireless Sensor Network Testing,” in <i>Proc. Int. Conf. Networked Sensing Systems (INSS)</i>, 2007, pp. 303–303, doi: <a href=\"https://doi.org/10.1109/INSS.2007.4297445\">10.1109/INSS.2007.4297445</a>.","short":"J. Beutel, M. Dyer, R. Lim, C. Plessl, M. Woehrle, M. Yuecel, L. Thiele, in: Proc. Int. Conf. Networked Sensing Systems (INSS), IEEE, Piscataway, NJ, USA, 2007, pp. 303–303.","mla":"Beutel, Jan, et al. “Automated Wireless Sensor Network Testing.” <i>Proc. Int. Conf. Networked Sensing Systems (INSS)</i>, IEEE, 2007, pp. 303–303, doi:<a href=\"https://doi.org/10.1109/INSS.2007.4297445\">10.1109/INSS.2007.4297445</a>.","chicago":"Beutel, Jan, Matthias Dyer, Roman Lim, Christian Plessl, Matthias Woehrle, Mustafa Yuecel, and Lothar Thiele. “Automated Wireless Sensor Network Testing.” In <i>Proc. Int. Conf. Networked Sensing Systems (INSS)</i>, 303–303. Piscataway, NJ, USA: IEEE, 2007. <a href=\"https://doi.org/10.1109/INSS.2007.4297445\">https://doi.org/10.1109/INSS.2007.4297445</a>.","ama":"Beutel J, Dyer M, Lim R, et al. Automated Wireless Sensor Network Testing. In: <i>Proc. Int. Conf. Networked Sensing Systems (INSS)</i>. IEEE; 2007:303-303. doi:<a href=\"https://doi.org/10.1109/INSS.2007.4297445\">10.1109/INSS.2007.4297445</a>","apa":"Beutel, J., Dyer, M., Lim, R., Plessl, C., Woehrle, M., Yuecel, M., &#38; Thiele, L. (2007). Automated Wireless Sensor Network Testing. <i>Proc. Int. Conf. Networked Sensing Systems (INSS)</i>, 303–303. <a href=\"https://doi.org/10.1109/INSS.2007.4297445\">https://doi.org/10.1109/INSS.2007.4297445</a>"},"language":[{"iso":"eng"}],"publication_identifier":{"isbn":["1-4244-1231-5"]}}