[{"page":"303-303","citation":{"chicago":"Beutel, Jan, Matthias Dyer, Roman Lim, Christian Plessl, Matthias Woehrle, Mustafa Yuecel, and Lothar Thiele. “Automated Wireless Sensor Network Testing.” In <i>Proc. Int. Conf. Networked Sensing Systems (INSS)</i>, 303–303. Piscataway, NJ, USA: IEEE, 2007. <a href=\"https://doi.org/10.1109/INSS.2007.4297445\">https://doi.org/10.1109/INSS.2007.4297445</a>.","ama":"Beutel J, Dyer M, Lim R, et al. Automated Wireless Sensor Network Testing. In: <i>Proc. Int. Conf. Networked Sensing Systems (INSS)</i>. Piscataway, NJ, USA: IEEE; 2007:303-303. doi:<a href=\"https://doi.org/10.1109/INSS.2007.4297445\">10.1109/INSS.2007.4297445</a>","short":"J. Beutel, M. Dyer, R. Lim, C. Plessl, M. Woehrle, M. Yuecel, L. Thiele, in: Proc. Int. Conf. Networked Sensing Systems (INSS), IEEE, Piscataway, NJ, USA, 2007, pp. 303–303.","mla":"Beutel, Jan, et al. “Automated Wireless Sensor Network Testing.” <i>Proc. Int. Conf. Networked Sensing Systems (INSS)</i>, IEEE, 2007, pp. 303–303, doi:<a href=\"https://doi.org/10.1109/INSS.2007.4297445\">10.1109/INSS.2007.4297445</a>.","ieee":"J. Beutel <i>et al.</i>, “Automated Wireless Sensor Network Testing,” in <i>Proc. Int. Conf. Networked Sensing Systems (INSS)</i>, 2007, pp. 303–303.","bibtex":"@inproceedings{Beutel_Dyer_Lim_Plessl_Woehrle_Yuecel_Thiele_2007, place={Piscataway, NJ, USA}, title={Automated Wireless Sensor Network Testing}, DOI={<a href=\"https://doi.org/10.1109/INSS.2007.4297445\">10.1109/INSS.2007.4297445</a>}, booktitle={Proc. Int. Conf. Networked Sensing Systems (INSS)}, publisher={IEEE}, author={Beutel, Jan and Dyer, Matthias and Lim, Roman and Plessl, Christian and Woehrle, Matthias and Yuecel, Mustafa and Thiele, Lothar}, year={2007}, pages={303–303} }","apa":"Beutel, J., Dyer, M., Lim, R., Plessl, C., Woehrle, M., Yuecel, M., &#38; Thiele, L. (2007). Automated Wireless Sensor Network Testing. In <i>Proc. Int. Conf. Networked Sensing Systems (INSS)</i> (pp. 303–303). Piscataway, NJ, USA: IEEE. <a href=\"https://doi.org/10.1109/INSS.2007.4297445\">https://doi.org/10.1109/INSS.2007.4297445</a>"},"user_id":"24135","publisher":"IEEE","year":"2007","title":"Automated Wireless Sensor Network Testing","date_updated":"2019-01-03T13:13:08Z","status":"public","doi":"10.1109/INSS.2007.4297445","author":[{"last_name":"Beutel","full_name":"Beutel, Jan","first_name":"Jan"},{"last_name":"Dyer","full_name":"Dyer, Matthias","first_name":"Matthias"},{"last_name":"Lim","full_name":"Lim, Roman","first_name":"Roman"},{"first_name":"Christian","id":"16153","last_name":"Plessl","orcid":"0000-0001-5728-9982","full_name":"Plessl, Christian"},{"last_name":"Woehrle","full_name":"Woehrle, Matthias","first_name":"Matthias"},{"first_name":"Mustafa","full_name":"Yuecel, Mustafa","last_name":"Yuecel"},{"first_name":"Lothar","full_name":"Thiele, Lothar","last_name":"Thiele"}],"department":[{"_id":"27"},{"_id":"518"}],"publication_identifier":{"isbn":["1-4244-1231-5"]},"keyword":["WSN","testing","verification"],"_id":"2393","place":"Piscataway, NJ, USA","date_created":"2018-04-17T13:35:55Z","publication":"Proc. Int. Conf. Networked Sensing Systems (INSS)","type":"conference"}]