{"doi":"10.1109/MWP.2019.8892128","date_updated":"2023-01-10T13:12:55Z","type":"conference","publication":"2019 International Topical Meeting on Microwave Photonics (MWP)","conference":{"end_date":"2019.10.10","start_date":"2019.10.07"},"page":"1-4","language":[{"iso":"eng"}],"title":"Integrated All Optical Sampling of Microwave Signals in Silicon Photonics","_id":"24054","department":[{"_id":"58"},{"_id":"230"}],"date_created":"2021-09-09T12:26:09Z","user_id":"15931","related_material":{"link":[{"relation":"confirmation","url":"https://ieeexplore.ieee.org/document/8892128"}]},"citation":{"apa":"Misra, A., Kress, C., Singh, K., Preussler, S., Scheytt, C., & Schneider, T. (2019). Integrated All Optical Sampling of Microwave Signals in Silicon Photonics. 2019 International Topical Meeting on Microwave Photonics (MWP), 1–4. https://doi.org/10.1109/MWP.2019.8892128","short":"A. Misra, C. Kress, K. Singh, S. Preussler, C. Scheytt, T. Schneider, in: 2019 International Topical Meeting on Microwave Photonics (MWP), Ottawa, ON, Canada, Canada, 2019, pp. 1–4.","chicago":"Misra, Arijit, Christian Kress, Karanveer Singh, Stefan Preussler, Christoph Scheytt, and Thomas Schneider. “Integrated All Optical Sampling of Microwave Signals in Silicon Photonics.” In 2019 International Topical Meeting on Microwave Photonics (MWP), 1–4. Ottawa, ON, Canada, Canada, 2019. https://doi.org/10.1109/MWP.2019.8892128.","ieee":"A. Misra, C. Kress, K. Singh, S. Preussler, C. Scheytt, and T. Schneider, “Integrated All Optical Sampling of Microwave Signals in Silicon Photonics,” in 2019 International Topical Meeting on Microwave Photonics (MWP), 2019, pp. 1–4, doi: 10.1109/MWP.2019.8892128.","bibtex":"@inproceedings{Misra_Kress_Singh_Preussler_Scheytt_Schneider_2019, place={Ottawa, ON, Canada, Canada}, title={Integrated All Optical Sampling of Microwave Signals in Silicon Photonics}, DOI={10.1109/MWP.2019.8892128}, booktitle={2019 International Topical Meeting on Microwave Photonics (MWP)}, author={Misra, Arijit and Kress, Christian and Singh, Karanveer and Preussler, Stefan and Scheytt, Christoph and Schneider, Thomas}, year={2019}, pages={1–4} }","ama":"Misra A, Kress C, Singh K, Preussler S, Scheytt C, Schneider T. Integrated All Optical Sampling of Microwave Signals in Silicon Photonics. In: 2019 International Topical Meeting on Microwave Photonics (MWP). ; 2019:1-4. doi:10.1109/MWP.2019.8892128","mla":"Misra, Arijit, et al. “Integrated All Optical Sampling of Microwave Signals in Silicon Photonics.” 2019 International Topical Meeting on Microwave Photonics (MWP), 2019, pp. 1–4, doi:10.1109/MWP.2019.8892128."},"year":"2019","place":"Ottawa, ON, Canada, Canada","status":"public","abstract":[{"lang":"eng","text":"Optical sampling of pseudo random microwave signals with sinc-shaped Nyquist pulse sequences has been demonstrated in an integrated silicon photonics platform. An electronic-photonic, co-integrated depletion type silicon intensity modulator with high extinction ratio has been used to sample the microwave signal with a sampling rate, which corresponds to three times its RF bandwidth. Thus, a sampling rate of 21 GSa/s is achieved with a 7 GHz modulator, with 3 dBm of differential input power."}],"author":[{"last_name":"Misra","full_name":"Misra, Arijit","first_name":"Arijit"},{"first_name":"Christian","full_name":"Kress, Christian","id":"13256","last_name":"Kress"},{"first_name":"Karanveer","full_name":"Singh, Karanveer","last_name":"Singh"},{"full_name":"Preussler, Stefan","last_name":"Preussler","first_name":"Stefan"},{"orcid":"https://orcid.org/0000-0002-5950-6618","first_name":"Christoph","full_name":"Scheytt, Christoph","id":"37144","last_name":"Scheytt"},{"first_name":"Thomas","last_name":"Schneider","full_name":"Schneider, Thomas"}]}