@inproceedings{24223,
  abstract     = {{This paper presents the design flow of using 
sampling technique for fault injection on sche-
matic level. The parameters used in the docu-
ment to calculate the likelihood could be modi-
fied by using more realistic data from the fab. 
With the help of the fault simulator, the whole 
design flow of the fault effect simulation can be 
realized automatically.}},
  author       = {{Wu, Liang and Abughannam, Saed and Müller, Wolfgang and Scheytt, Christoph and Ecker, Wolfgang}},
  booktitle    = {{2nd Workshop on Resiliency in Embedded Electronic Systems (REES)}},
  pages        = {{68}},
  title        = {{{SPICE-Level Fault Injection with Likelihood Weighted Random Sampling - A Case Study}}},
  year         = {{2017}},
}