SPICE-Level Fault Injection with Likelihood Weighted Random Sampling

conference paper SPICE-Level Fault Injection with Likelihood Weighted Random Sampling - A Case Study Liang Wu author 30401 Saed Abughannam author 37628 Wolfgang Müller author 16243 Christoph Scheytt author 37144 Wolfgang Ecker author 58 department This paper presents the design flow of using sampling technique for fault injection on sche- matic level. The parameters used in the docu- ment to calculate the likelihood could be modi- fied by using more realistic data from the fab. With the help of the fault simulator, the whole design flow of the fault effect simulation can be realized automatically. 2017 eng 2nd Workshop on Resiliency in Embedded Electronic Systems (REES) 68 https://past.date-conference.com/date17/conference/workshop-w05 Wu, Liang, et al. “SPICE-Level Fault Injection with Likelihood Weighted Random Sampling - A Case Study.” 2nd Workshop on Resiliency in Embedded Electronic Systems (REES), 2017, p. 68. Wu L, Abughannam S, Müller W, Scheytt C, Ecker W. SPICE-Level Fault Injection with Likelihood Weighted Random Sampling - A Case Study. In: 2nd Workshop on Resiliency in Embedded Electronic Systems (REES). ; 2017:68. @inproceedings{Wu_Abughannam_Müller_Scheytt_Ecker_2017, place={Lausanne, Switzerland}, title={SPICE-Level Fault Injection with Likelihood Weighted Random Sampling - A Case Study}, booktitle={2nd Workshop on Resiliency in Embedded Electronic Systems (REES)}, author={Wu, Liang and Abughannam, Saed and Müller, Wolfgang and Scheytt, Christoph and Ecker, Wolfgang}, year={2017}, pages={68} } Wu, L., Abughannam, S., Müller, W., Scheytt, C., & Ecker, W. (2017). SPICE-Level Fault Injection with Likelihood Weighted Random Sampling - A Case Study. 2nd Workshop on Resiliency in Embedded Electronic Systems (REES), 68. L. Wu, S. Abughannam, W. Müller, C. Scheytt, and W. Ecker, “SPICE-Level Fault Injection with Likelihood Weighted Random Sampling - A Case Study,” in 2nd Workshop on Resiliency in Embedded Electronic Systems (REES), 2017, p. 68. Wu, Liang, Saed Abughannam, Wolfgang Müller, Christoph Scheytt, and Wolfgang Ecker. “SPICE-Level Fault Injection with Likelihood Weighted Random Sampling - A Case Study.” In 2nd Workshop on Resiliency in Embedded Electronic Systems (REES), 68. Lausanne, Switzerland, 2017. L. Wu, S. Abughannam, W. Müller, C. Scheytt, W. Ecker, in: 2nd Workshop on Resiliency in Embedded Electronic Systems (REES), Lausanne, Switzerland, 2017, p. 68. 242232021-09-13T08:20:39Z2022-01-06T06:56:13Z