{"language":[{"iso":"eng"}],"citation":{"chicago":"Adelt, Peer, Bastian Koppelmann, Wolfgang Müller, Bernd Kleinjohann, and Christoph Scheytt. “An Automatic Injection Framework for Safety Assessements of Embedded Software Binaries.” In <i>2nd Workshop on Resiliency in Embedded Electronic Systems (REES) </i>, 44. Lausanne, Switzerland, 2017.","bibtex":"@inproceedings{Adelt_Koppelmann_Müller_Kleinjohann_Scheytt_2017, place={Lausanne, Switzerland}, title={An Automatic Injection Framework for Safety Assessements of Embedded Software Binaries}, booktitle={2nd Workshop on Resiliency in Embedded Electronic Systems (REES) }, author={Adelt, Peer and Koppelmann, Bastian and Müller, Wolfgang and Kleinjohann, Bernd and Scheytt, Christoph}, year={2017}, pages={44} }","ieee":"P. Adelt, B. Koppelmann, W. Müller, B. Kleinjohann, and C. Scheytt, “An Automatic Injection Framework for Safety Assessements of Embedded Software Binaries,” in <i>2nd Workshop on Resiliency in Embedded Electronic Systems (REES) </i>, 2017, p. 44.","mla":"Adelt, Peer, et al. “An Automatic Injection Framework for Safety Assessements of Embedded Software Binaries.” <i>2nd Workshop on Resiliency in Embedded Electronic Systems (REES) </i>, 2017, p. 44.","apa":"Adelt, P., Koppelmann, B., Müller, W., Kleinjohann, B., &#38; Scheytt, C. (2017). An Automatic Injection Framework for Safety Assessements of Embedded Software Binaries. <i>2nd Workshop on Resiliency in Embedded Electronic Systems (REES) </i>, 44.","short":"P. Adelt, B. Koppelmann, W. Müller, B. Kleinjohann, C. Scheytt, in: 2nd Workshop on Resiliency in Embedded Electronic Systems (REES) , Lausanne, Switzerland, 2017, p. 44.","ama":"Adelt P, Koppelmann B, Müller W, Kleinjohann B, Scheytt C. An Automatic Injection Framework for Safety Assessements of Embedded Software Binaries. In: <i>2nd Workshop on Resiliency in Embedded Electronic Systems (REES) </i>. ; 2017:44."},"date_updated":"2022-01-06T06:56:13Z","year":"2017","title":"An Automatic Injection Framework for Safety Assessements of Embedded Software Binaries","type":"conference","status":"public","_id":"24225","related_material":{"link":[{"url":"https://www.edacentrum.de/rees/program","relation":"confirmation"}]},"page":"44","user_id":"15931","publication":"2nd Workshop on Resiliency in Embedded Electronic Systems (REES) ","date_created":"2021-09-13T08:20:41Z","department":[{"_id":"58"}],"place":"Lausanne, Switzerland","author":[{"first_name":"Peer","full_name":"Adelt, Peer","last_name":"Adelt","id":"5603"},{"last_name":"Koppelmann","id":"25260","full_name":"Koppelmann, Bastian","first_name":"Bastian"},{"id":"16243","last_name":"Müller","full_name":"Müller, Wolfgang","first_name":"Wolfgang"},{"last_name":"Kleinjohann","full_name":"Kleinjohann, Bernd","first_name":"Bernd"},{"last_name":"Scheytt","id":"37144","full_name":"Scheytt, Christoph","first_name":"Christoph"}]}