--- _id: '24225' author: - first_name: Peer full_name: Adelt, Peer id: '5603' last_name: Adelt - first_name: Bastian full_name: Koppelmann, Bastian id: '25260' last_name: Koppelmann - first_name: Wolfgang full_name: Müller, Wolfgang id: '16243' last_name: Müller - first_name: Bernd full_name: Kleinjohann, Bernd last_name: Kleinjohann - first_name: Christoph full_name: Scheytt, Christoph id: '37144' last_name: Scheytt citation: ama: 'Adelt P, Koppelmann B, Müller W, Kleinjohann B, Scheytt C. An Automatic Injection Framework for Safety Assessements of Embedded Software Binaries. In: 2nd Workshop on Resiliency in Embedded Electronic Systems (REES) . ; 2017:44.' apa: Adelt, P., Koppelmann, B., Müller, W., Kleinjohann, B., & Scheytt, C. (2017). An Automatic Injection Framework for Safety Assessements of Embedded Software Binaries. 2nd Workshop on Resiliency in Embedded Electronic Systems (REES) , 44. bibtex: '@inproceedings{Adelt_Koppelmann_Müller_Kleinjohann_Scheytt_2017, place={Lausanne, Switzerland}, title={An Automatic Injection Framework for Safety Assessements of Embedded Software Binaries}, booktitle={2nd Workshop on Resiliency in Embedded Electronic Systems (REES) }, author={Adelt, Peer and Koppelmann, Bastian and Müller, Wolfgang and Kleinjohann, Bernd and Scheytt, Christoph}, year={2017}, pages={44} }' chicago: Adelt, Peer, Bastian Koppelmann, Wolfgang Müller, Bernd Kleinjohann, and Christoph Scheytt. “An Automatic Injection Framework for Safety Assessements of Embedded Software Binaries.” In 2nd Workshop on Resiliency in Embedded Electronic Systems (REES) , 44. Lausanne, Switzerland, 2017. ieee: P. Adelt, B. Koppelmann, W. Müller, B. Kleinjohann, and C. Scheytt, “An Automatic Injection Framework for Safety Assessements of Embedded Software Binaries,” in 2nd Workshop on Resiliency in Embedded Electronic Systems (REES) , 2017, p. 44. mla: Adelt, Peer, et al. “An Automatic Injection Framework for Safety Assessements of Embedded Software Binaries.” 2nd Workshop on Resiliency in Embedded Electronic Systems (REES) , 2017, p. 44. short: 'P. Adelt, B. Koppelmann, W. Müller, B. Kleinjohann, C. Scheytt, in: 2nd Workshop on Resiliency in Embedded Electronic Systems (REES) , Lausanne, Switzerland, 2017, p. 44.' date_created: 2021-09-13T08:20:41Z date_updated: 2022-01-06T06:56:13Z department: - _id: '58' language: - iso: eng page: '44' place: Lausanne, Switzerland publication: '2nd Workshop on Resiliency in Embedded Electronic Systems (REES) ' related_material: link: - relation: confirmation url: https://www.edacentrum.de/rees/program status: public title: An Automatic Injection Framework for Safety Assessements of Embedded Software Binaries type: conference user_id: '15931' year: '2017' ...