---
_id: '24225'
author:
- first_name: Peer
full_name: Adelt, Peer
id: '5603'
last_name: Adelt
- first_name: Bastian
full_name: Koppelmann, Bastian
id: '25260'
last_name: Koppelmann
- first_name: Wolfgang
full_name: Müller, Wolfgang
id: '16243'
last_name: Müller
- first_name: Bernd
full_name: Kleinjohann, Bernd
last_name: Kleinjohann
- first_name: Christoph
full_name: Scheytt, Christoph
id: '37144'
last_name: Scheytt
citation:
ama: 'Adelt P, Koppelmann B, Müller W, Kleinjohann B, Scheytt C. An Automatic Injection
Framework for Safety Assessements of Embedded Software Binaries. In: 2nd Workshop
on Resiliency in Embedded Electronic Systems (REES) . ; 2017:44.'
apa: Adelt, P., Koppelmann, B., Müller, W., Kleinjohann, B., & Scheytt, C. (2017).
An Automatic Injection Framework for Safety Assessements of Embedded Software
Binaries. 2nd Workshop on Resiliency in Embedded Electronic Systems (REES)
, 44.
bibtex: '@inproceedings{Adelt_Koppelmann_Müller_Kleinjohann_Scheytt_2017, place={Lausanne,
Switzerland}, title={An Automatic Injection Framework for Safety Assessements
of Embedded Software Binaries}, booktitle={2nd Workshop on Resiliency in Embedded
Electronic Systems (REES) }, author={Adelt, Peer and Koppelmann, Bastian and Müller,
Wolfgang and Kleinjohann, Bernd and Scheytt, Christoph}, year={2017}, pages={44}
}'
chicago: Adelt, Peer, Bastian Koppelmann, Wolfgang Müller, Bernd Kleinjohann, and
Christoph Scheytt. “An Automatic Injection Framework for Safety Assessements of
Embedded Software Binaries.” In 2nd Workshop on Resiliency in Embedded Electronic
Systems (REES) , 44. Lausanne, Switzerland, 2017.
ieee: P. Adelt, B. Koppelmann, W. Müller, B. Kleinjohann, and C. Scheytt, “An Automatic
Injection Framework for Safety Assessements of Embedded Software Binaries,” in
2nd Workshop on Resiliency in Embedded Electronic Systems (REES) , 2017,
p. 44.
mla: Adelt, Peer, et al. “An Automatic Injection Framework for Safety Assessements
of Embedded Software Binaries.” 2nd Workshop on Resiliency in Embedded Electronic
Systems (REES) , 2017, p. 44.
short: 'P. Adelt, B. Koppelmann, W. Müller, B. Kleinjohann, C. Scheytt, in: 2nd
Workshop on Resiliency in Embedded Electronic Systems (REES) , Lausanne, Switzerland,
2017, p. 44.'
date_created: 2021-09-13T08:20:41Z
date_updated: 2022-01-06T06:56:13Z
department:
- _id: '58'
language:
- iso: eng
page: '44'
place: Lausanne, Switzerland
publication: '2nd Workshop on Resiliency in Embedded Electronic Systems (REES) '
related_material:
link:
- relation: confirmation
url: https://www.edacentrum.de/rees/program
status: public
title: An Automatic Injection Framework for Safety Assessements of Embedded Software
Binaries
type: conference
user_id: '15931'
year: '2017'
...