{"department":[{"_id":"58"}],"title":"On the Correlation of HW Faults and SW Errors","date_updated":"2022-02-17T10:08:53Z","publication":"Proceedings of the 1st International Workshop on Resiliency in Embedded Electronic Systems (REES 2014)","date_created":"2021-09-14T07:06:31Z","editor":[{"full_name":"Mueller-Gritschneder, Daniel","last_name":"Mueller-Gritschneder","first_name":"Daniel"},{"first_name":"Wolfgang","last_name":"Müller","full_name":"Müller, Wolfgang"},{"last_name":"Mitra","full_name":"Mitra, Subhasish","first_name":"Subhasish"}],"status":"public","user_id":"15931","type":"conference","language":[{"iso":"eng"}],"_id":"24289","citation":{"chicago":"Müller, Wolfgang, Liang Wu, Christoph Scheytt, Markus Becker, and Sven Schoenberg. “On the Correlation of HW Faults and SW Errors.” In <i>Proceedings of the 1st International Workshop on Resiliency in Embedded Electronic Systems (REES 2014)</i>, edited by Daniel Mueller-Gritschneder, Wolfgang Müller, and Subhasish Mitra. Amsterdam, Netherland, 2015.","ama":"Müller W, Wu L, Scheytt C, Becker M, Schoenberg S. On the Correlation of HW Faults and SW Errors. In: Mueller-Gritschneder D, Müller W, Mitra S, eds. <i>Proceedings of the 1st International Workshop on Resiliency in Embedded Electronic Systems (REES 2014)</i>. ; 2015.","short":"W. Müller, L. Wu, C. Scheytt, M. Becker, S. Schoenberg, in: D. Mueller-Gritschneder, W. Müller, S. Mitra (Eds.), Proceedings of the 1st International Workshop on Resiliency in Embedded Electronic Systems (REES 2014), Amsterdam, Netherland, 2015.","mla":"Müller, Wolfgang, et al. “On the Correlation of HW Faults and SW Errors.” <i>Proceedings of the 1st International Workshop on Resiliency in Embedded Electronic Systems (REES 2014)</i>, edited by Daniel Mueller-Gritschneder et al., 2015.","apa":"Müller, W., Wu, L., Scheytt, C., Becker, M., &#38; Schoenberg, S. (2015). On the Correlation of HW Faults and SW Errors. In D. Mueller-Gritschneder, W. Müller, &#38; S. Mitra (Eds.), <i>Proceedings of the 1st International Workshop on Resiliency in Embedded Electronic Systems (REES 2014)</i>.","bibtex":"@inproceedings{Müller_Wu_Scheytt_Becker_Schoenberg_2015, place={Amsterdam, Netherland}, title={On the Correlation of HW Faults and SW Errors}, booktitle={Proceedings of the 1st International Workshop on Resiliency in Embedded Electronic Systems (REES 2014)}, author={Müller, Wolfgang and Wu, Liang and Scheytt, Christoph and Becker, Markus and Schoenberg, Sven}, editor={Mueller-Gritschneder, Daniel and Müller, Wolfgang and Mitra, Subhasish}, year={2015} }","ieee":"W. Müller, L. Wu, C. Scheytt, M. Becker, and S. Schoenberg, “On the Correlation of HW Faults and SW Errors,” in <i>Proceedings of the 1st International Workshop on Resiliency in Embedded Electronic Systems (REES 2014)</i>, 2015."},"author":[{"id":"16243","first_name":"Wolfgang","last_name":"Müller","full_name":"Müller, Wolfgang"},{"id":"30401","full_name":"Wu, Liang","last_name":"Wu","first_name":"Liang"},{"id":"37144","first_name":"Christoph","last_name":"Scheytt","full_name":"Scheytt, Christoph"},{"first_name":"Markus","last_name":"Becker","full_name":"Becker, Markus"},{"full_name":"Schoenberg, Sven","last_name":"Schoenberg","first_name":"Sven"}],"year":"2015","place":"Amsterdam, Netherland"}