---
_id: '24289'
author:
- first_name: Wolfgang
  full_name: Müller, Wolfgang
  id: '16243'
  last_name: Müller
- first_name: Liang
  full_name: Wu, Liang
  id: '30401'
  last_name: Wu
- first_name: Christoph
  full_name: Scheytt, Christoph
  id: '37144'
  last_name: Scheytt
- first_name: Markus
  full_name: Becker, Markus
  last_name: Becker
- first_name: Sven
  full_name: Schoenberg, Sven
  last_name: Schoenberg
citation:
  ama: 'Müller W, Wu L, Scheytt C, Becker M, Schoenberg S. On the Correlation of HW
    Faults and SW Errors. In: Mueller-Gritschneder D, Müller W, Mitra S, eds. <i>Proceedings
    of the 1st International Workshop on Resiliency in Embedded Electronic Systems
    (REES 2014)</i>. ; 2015.'
  apa: Müller, W., Wu, L., Scheytt, C., Becker, M., &#38; Schoenberg, S. (2015). On
    the Correlation of HW Faults and SW Errors. In D. Mueller-Gritschneder, W. Müller,
    &#38; S. Mitra (Eds.), <i>Proceedings of the 1st International Workshop on Resiliency
    in Embedded Electronic Systems (REES 2014)</i>.
  bibtex: '@inproceedings{Müller_Wu_Scheytt_Becker_Schoenberg_2015, place={Amsterdam,
    Netherland}, title={On the Correlation of HW Faults and SW Errors}, booktitle={Proceedings
    of the 1st International Workshop on Resiliency in Embedded Electronic Systems
    (REES 2014)}, author={Müller, Wolfgang and Wu, Liang and Scheytt, Christoph and
    Becker, Markus and Schoenberg, Sven}, editor={Mueller-Gritschneder, Daniel and
    Müller, Wolfgang and Mitra, Subhasish}, year={2015} }'
  chicago: Müller, Wolfgang, Liang Wu, Christoph Scheytt, Markus Becker, and Sven
    Schoenberg. “On the Correlation of HW Faults and SW Errors.” In <i>Proceedings
    of the 1st International Workshop on Resiliency in Embedded Electronic Systems
    (REES 2014)</i>, edited by Daniel Mueller-Gritschneder, Wolfgang Müller, and Subhasish
    Mitra. Amsterdam, Netherland, 2015.
  ieee: W. Müller, L. Wu, C. Scheytt, M. Becker, and S. Schoenberg, “On the Correlation
    of HW Faults and SW Errors,” in <i>Proceedings of the 1st International Workshop
    on Resiliency in Embedded Electronic Systems (REES 2014)</i>, 2015.
  mla: Müller, Wolfgang, et al. “On the Correlation of HW Faults and SW Errors.” <i>Proceedings
    of the 1st International Workshop on Resiliency in Embedded Electronic Systems
    (REES 2014)</i>, edited by Daniel Mueller-Gritschneder et al., 2015.
  short: 'W. Müller, L. Wu, C. Scheytt, M. Becker, S. Schoenberg, in: D. Mueller-Gritschneder,
    W. Müller, S. Mitra (Eds.), Proceedings of the 1st International Workshop on Resiliency
    in Embedded Electronic Systems (REES 2014), Amsterdam, Netherland, 2015.'
date_created: 2021-09-14T07:06:31Z
date_updated: 2022-02-17T10:08:53Z
department:
- _id: '58'
editor:
- first_name: Daniel
  full_name: Mueller-Gritschneder, Daniel
  last_name: Mueller-Gritschneder
- first_name: Wolfgang
  full_name: Müller, Wolfgang
  last_name: Müller
- first_name: Subhasish
  full_name: Mitra, Subhasish
  last_name: Mitra
language:
- iso: eng
place: Amsterdam, Netherland
publication: Proceedings of the 1st International Workshop on Resiliency in Embedded
  Electronic Systems (REES 2014)
status: public
title: On the Correlation of HW Faults and SW Errors
type: conference
user_id: '15931'
year: '2015'
...