Design and Measurement Techniques for an 80 Gb/s 1-Tap Decision Feedback Equalizer Awny, Ahmed Möller, Lothar Junio, Josef Scheytt, Christoph Thiede, Andreas A millimeter wave frequency mixed-signal design of a 1-tap half-rate look-ahead decision feedback equalizer for 80 Gb/s short-reach optical communication systems is presented. On-wafer tests are developed to determine the maximum operating bit rate of the equalizer. Results are also presented for intersymbol interference mitigation at 80 Gb/s for a 20 GHz bandwidth-limited channel. Further improvements on the architecture of the 80 Gb/s equalizer are discussed and used in the design and on-wafer measurement of a 110 Gb/s equalizer. The equalizers are designed in a 0.13 μm SiGe:C BiCMOS technology. The 80 and 110 Gb/s versions dissipate 4 and 5.75 W, respectively and occupy 2 and 2.56 mm 2 , respectively. 2014 info:eu-repo/semantics/article doc-type:article text http://purl.org/coar/resource_type/c_6501 https://ris.uni-paderborn.de/record/24310 Awny A, Möller L, Junio J, Scheytt C, Thiede A. Design and Measurement Techniques for an 80 Gb/s 1-Tap Decision Feedback Equalizer. <i>IEEE JOURNAL OF SOLID-STATE CIRCUITS</i>. 2014;Vol.49(No.2):452-470. doi:<a href="https://doi.org/10.1109/JSSC.2013.2285385">10.1109/JSSC.2013.2285385</a> eng info:eu-repo/semantics/altIdentifier/doi/10.1109/JSSC.2013.2285385 info:eu-repo/semantics/altIdentifier/issn/1558-173X info:eu-repo/semantics/closedAccess