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<titleInfo><title>Design and Measurement Techniques for an 80 Gb/s 1-Tap Decision Feedback Equalizer</title></titleInfo>





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  <namePart type="given">Ahmed</namePart>
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  <namePart type="given">Lothar</namePart>
  <namePart type="family">Möller</namePart>
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  <namePart type="given">Josef</namePart>
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  <namePart type="given">Christoph</namePart>
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  <namePart type="given">Andreas</namePart>
  <namePart type="family">Thiede</namePart>
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<abstract lang="eng">A millimeter wave frequency mixed-signal design of a 1-tap half-rate look-ahead decision feedback equalizer for 80 Gb/s short-reach optical communication systems is presented. On-wafer tests are developed to determine the maximum operating bit rate of the equalizer. Results are also presented for intersymbol interference mitigation at 80 Gb/s for a 20 GHz bandwidth-limited channel. Further improvements on the architecture of the 80 Gb/s equalizer are discussed and used in the design and on-wafer measurement of a 110 Gb/s equalizer. The equalizers are designed in a 0.13 μm SiGe:C BiCMOS technology. The 80 and 110 Gb/s versions dissipate 4 and 5.75 W, respectively and occupy 2 and 2.56 mm 2 , respectively.</abstract>

<originInfo><dateIssued encoding="w3cdtf">2014</dateIssued>
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<relatedItem type="host"><titleInfo><title>IEEE JOURNAL OF SOLID-STATE CIRCUITS</title></titleInfo>
  <identifier type="eIssn">1558-173X</identifier><identifier type="doi">10.1109/JSSC.2013.2285385</identifier>
<part><detail type="volume"><number>Vol.49</number></detail><detail type="issue"><number>No.2</number></detail><extent unit="pages">452-470</extent>
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     <url>https://ieeexplore.ieee.org/document/6648461</url>
  
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<mla>Awny, Ahmed, et al. “Design and Measurement Techniques for an 80 Gb/s 1-Tap Decision Feedback Equalizer.” &lt;i&gt;IEEE JOURNAL OF SOLID-STATE CIRCUITS&lt;/i&gt;, vol. Vol.49, no. No.2, 2014, pp. 452–70, doi:&lt;a href=&quot;https://doi.org/10.1109/JSSC.2013.2285385&quot;&gt;10.1109/JSSC.2013.2285385&lt;/a&gt;.</mla>
<ama>Awny A, Möller L, Junio J, Scheytt C, Thiede A. Design and Measurement Techniques for an 80 Gb/s 1-Tap Decision Feedback Equalizer. &lt;i&gt;IEEE JOURNAL OF SOLID-STATE CIRCUITS&lt;/i&gt;. 2014;Vol.49(No.2):452-470. doi:&lt;a href=&quot;https://doi.org/10.1109/JSSC.2013.2285385&quot;&gt;10.1109/JSSC.2013.2285385&lt;/a&gt;</ama>
<bibtex>@article{Awny_Möller_Junio_Scheytt_Thiede_2014, title={Design and Measurement Techniques for an 80 Gb/s 1-Tap Decision Feedback Equalizer}, volume={Vol.49}, DOI={&lt;a href=&quot;https://doi.org/10.1109/JSSC.2013.2285385&quot;&gt;10.1109/JSSC.2013.2285385&lt;/a&gt;}, number={No.2}, journal={IEEE JOURNAL OF SOLID-STATE CIRCUITS}, author={Awny, Ahmed and Möller, Lothar and Junio, Josef and Scheytt, Christoph and Thiede, Andreas}, year={2014}, pages={452–470} }</bibtex>
<apa>Awny, A., Möller, L., Junio, J., Scheytt, C., &amp;#38; Thiede, A. (2014). Design and Measurement Techniques for an 80 Gb/s 1-Tap Decision Feedback Equalizer. &lt;i&gt;IEEE JOURNAL OF SOLID-STATE CIRCUITS&lt;/i&gt;, &lt;i&gt;Vol.49&lt;/i&gt;(No.2), 452–470. &lt;a href=&quot;https://doi.org/10.1109/JSSC.2013.2285385&quot;&gt;https://doi.org/10.1109/JSSC.2013.2285385&lt;/a&gt;</apa>
<ieee>A. Awny, L. Möller, J. Junio, C. Scheytt, and A. Thiede, “Design and Measurement Techniques for an 80 Gb/s 1-Tap Decision Feedback Equalizer,” &lt;i&gt;IEEE JOURNAL OF SOLID-STATE CIRCUITS&lt;/i&gt;, vol. Vol.49, no. No.2, pp. 452–470, 2014, doi: &lt;a href=&quot;https://doi.org/10.1109/JSSC.2013.2285385&quot;&gt;10.1109/JSSC.2013.2285385&lt;/a&gt;.</ieee>
<short>A. Awny, L. Möller, J. Junio, C. Scheytt, A. Thiede, IEEE JOURNAL OF SOLID-STATE CIRCUITS Vol.49 (2014) 452–470.</short>
<chicago>Awny, Ahmed, Lothar Möller, Josef Junio, Christoph Scheytt, and Andreas Thiede. “Design and Measurement Techniques for an 80 Gb/s 1-Tap Decision Feedback Equalizer.” &lt;i&gt;IEEE JOURNAL OF SOLID-STATE CIRCUITS&lt;/i&gt; Vol.49, no. No.2 (2014): 452–70. &lt;a href=&quot;https://doi.org/10.1109/JSSC.2013.2285385&quot;&gt;https://doi.org/10.1109/JSSC.2013.2285385&lt;/a&gt;.</chicago>
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